Inspection method and inspection apparatus
AssigneeNuFlare Technology, Inc.
InventorsMakoto Yabe, Hiroteru Akiyama, Takafumi Inoue
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AssigneeNuFlare Technology, Inc.
InventorsMakoto Yabe, Hiroteru Akiyama, Takafumi Inoue
Estimating the term…
An inspection method includes a rough alignment process of acquiring optical images of first and second patterns previously set to confirm whether a position misalignment amount in a rotation direction of a sample with respect to an X or Y direction is equal to or smaller than a first acceptable value, and conforming whether the position misalignment amount is equal to or smaller than the first acceptable value on the basis of an acquisition result, and a fine alignment process of acquiring optical images of third patterns positioned on different corners of a rectangular frame constituted of four sides along the X or Y direction on an optical image of the sample and rotating a stage until a position misalignment amount detected based on the optical images of the third patterns becomes equal to or smaller than a second acceptable value being smaller than the first acceptable value.
An inspection method of inspecting defects of patterns provided in an inspection region of a sample, using an inspection apparatus comprising a stage having an XY plane on which the sample can be placed and being movable in an X direction and a Y direction and rotatable on a Z axis substantially perpendicular to the XY plane, the method comprising:
An inspection apparatus inspecting defects of patterns provided in an inspection region of a sample and comprising a stage having an XY plane on which the sample can be placed and being movable in an X direction and a Y direction and rotatable on a Z axis substantially perpendicular to the XY plane, the apparatus comprising:
Dependencies are inferred from the claim text.