X-ray detection of X-ray incident fringe pattern in phase-contrast and/or dark-field X-ray imaging

An interferometer for phase contrast or dark-field X-ray imaging, comprising:

• a phase grating structure, and
• an X-ray detector comprising:
• a structured scintillator layer comprising a plurality of slabs arranged to sample the incident fringe pattern and convert it into a plurality of optical slab signals;
• an optical detector layer in optical communication with the structured scintillator layer comprising a plurality of sub-pixels, wherein each sub-pixel is aligned with a respective slab of the structured scintillator layer to detect a respective optical slab signal emitted from the respective slab of the structured scintillator layer;
• and
• a signal combination arrangement arranged to electronically read-out signals representing the fringe pattern from the plurality of sub-pixels;
• wherein the sub-pixels further comprise a plurality of optical detection cells configured to provide a plurality of detection signals based on the presence of related optical slab signals;
• wherein the signal combination arrangement is configured to enable the acquisition of phase contrast and/or dark field X-ray images at a first and second detection direction without adjusting the position of the X-ray detector by generating at least first and second output signals as combinations of the detection signals of the optical detection cells of the optical detector layer, wherein the at least first and second output signals are each proportional to a spatial signal amplitude due to the incident X-ray fringe pattern received on a respective slab of the structured scintillator layer, and wherein a pixel signal of the X-ray detector comprises at least first and second output signals acquired from at least two adjacent sub-pixels at a fringe sampling resolution defined by a width of the slabs;
• wherein the phase grating structure and the X-ray detector are arranged in an optical path such that the phase grating structure and the scintillator layer of the X-ray detector form an interferometer arrangement for correlating X-ray radiation.

An X-ray imaging system, comprising:

• an X-ray source;
• an interferometer comprising:
• a phase grating structure, and
• an X-ray detector comprising:
• a structured scintillator layer comprising a plurality of slabs arranged to sample the incident fringe pattern and convert it into a plurality of optical slab signals;
• an optical detector layer in optical communication with the structured scintillator layer comprising a plurality of sub-pixels, wherein each sub-pixel is aligned with a respective slab of the structured scintillator layer to detect a respective optical slab signal emitted from the respective slab of the structured scintillator layer;
• and
• a signal combination arrangement arranged to electronically read-out signals representing the fringe pattern from the plurality of sub-pixels;
• wherein the sub-pixels further comprise a plurality of optical detection cells configured to provide a plurality of detection signals based on the presence of related optical slab signals;
• wherein the signal combination arrangement is configured to enable the acquisition of phase contrast and/or dark field X-ray images at a first and second detection direction without adjusting the position of the X-ray detector by generating at least first and second output signals as combinations of the detection signals of the optical detection cells of the optical detector layer, wherein the at least first and second output signals are each proportional to a spatial signal amplitude due to the incident X-ray fringe pattern received on a respective slab of the structured scintillator layer, and wherein a pixel signal of the X-ray detector comprises at least first and second output signals acquired from at least two adjacent sub-pixels at a fringe sampling resolution defined by a width of the slabs;
• wherein the phase grating structure and the X-ray detector are arranged in an optical path such that the phase grating structure and the scintillator layer of the X-ray detector form an interferometer arrangement for correlating X-ray radiation;
• and
• a controller;
• wherein the controller is configured to activate the X-ray source to apply X-ray radiation to an object of interest positionable in the optical path;
• wherein the X-ray detector of the interferometer is configured to sample and detect an X-ray wave front;
• and
• wherein the controller is configured to electronically read-out signals representing the fringe pattern from the plurality of sub-pixels of the X-ray detector of the interferometer.

A method for phase contrast X-ray imaging and/or dark-field X-ray imaging, comprising:

• generating X ray radiation to examine an object of interest, and directing the X-ray radiation towards an object of interest;
• receiving at an X-ray detector the X-ray radiation which has been phase-modulated by the object of interest;
• converting the modulated X-ray radiation into a plurality of optical slab signals using a structured scintillator layer comprising a plurality of slabs arranged to sample the incident fringe pattern;
• detecting the plurality of optical slab signals using an optical detector layer in optical communication with the structured scintillator layer comprising a plurality of sub-pixels, wherein each sub-pixel is aligned with a respective slab of the structured scintillator layer to detect a respective optical slab signal emitted from the respective slab of the structured scintillator layer, wherein the optical detector layer further comprises a plurality of optical detection cells configured to provide a plurality of detection signals based on the presence of related optical slab signals;
• and
• electronically reading out signals representing the fringe pattern from the plurality of sub-pixels using a signal combination arrangement, wherein the signal combination arrangement is configured to enable the acquisition of phase contrast and/or dark field X-ray images at a first and second detection direction without adjusting the position of the X-ray detector by generating at least first and second output signals as combinations of the detection signals of the optical detection cells of the optical detector layer, wherein the at least first and second output signals are each proportional to a spatial signal amplitude due to the incident X-ray fringe pattern received on a respective slab of the structured scintillator layer, and wherein a pixel signal of the X-ray detector comprises at least first and second output signals acquired from at least two adjacent sub-pixels at a fringe sampling resolution defined by a width of the slabs.

A non-transitory computer-readable medium having one or more executable instructions, which, when executed by a processor, cause the processor to perform a method for phase contrast X-ray imaging and/or dark-field X-ray imaging, the method comprising:

• generating X-ray radiation to examine an object of interest, and directing the X-ray radiation towards an object of interest;
• receiving at an X-ray detector the X-ray radiation which has been phase-modulated by the object of interest;
• converting the modulated X-ray radiation into a plurality of optical slab signals using a structured scintillator layer comprising a plurality of slabs arranged to sample the incident fringe pattern;
• detecting the plurality of optical slab signals using an optical detector layer in optical communication with the structured scintillator layer comprising a plurality of sub-pixels, wherein each sub-pixel is aligned with a respective slab of the structured scintillator layer to detect a respective optical slab signal emitted from the respective slab of the structured scintillator layer, wherein the optical detector layer further comprises a plurality of optical detection cells configured to provide a plurality of detection signals based on the presence of related optical slab signals;
• and
• electronically reading out signals representing the fringe pattern from the plurality of sub-pixels using a signal combination arrangement, wherein the signal combination arrangement is configured to enable the acquisition of phase contrast and/or dark field X-ray images at a first and second detection direction without adjusting the position of the X-ray detector by generating at least first and second output signals as combinations of the detection signals of the optical detection cells of the optical detector layer, wherein the at least first and second output signals are each proportional to a spatial signal amplitude due to the incident X-ray fringe pattern received on a respective slab of the structured scintillator layer, and wherein a pixel signal of the X-ray detector comprises at least first and second output signals acquired from at least two adjacent sub-pixels at a fringe sampling resolution defined by a width of the slabs.