Sample-analyzing system

A sample-analyzing system for identifying a target sample from measurement data of the target sample obtained using a plurality of analyzing devices including a fluorescent X-ray analyzer as well as at least one device selected from an infrared spectrophotometer and a Raman spectrophotometer, the system comprising:

• a) a storage section in which measurement data obtained for each of a plurality of reference objects using each of the analyzing devices are stored;
• b) a measurement data comparator for comparing, for each of the analyzing devices, the measurement data of the target sample with the measurement data of the plurality of reference objects and for determining a degree of matching of the target sample with each of the plurality of reference objects;
• c) an integrated degree-of-matching calculator for calculating an integrated degree of matching for each of the plurality of reference objects by integrating the degrees of matching determined for the plurality of analyzing devices;
• d) a comparison result output section for outputting information concerning a predetermined number of reference objects in descending order of the integrated degree of matching,
• e) a scattered radiation intensity ratio calculator for calculating an intensity ratio between Compton scattered radiation and Rayleigh scattered radiation from the measurement data of the target sample obtained using the fluorescent X-ray analyzer;
• and
• f) a coefficient determiner for determining, based on the intensity ratio, a coefficient for weighting degrees of matching related to the fluorescent X-ray analyzer and the infrared spectrophotometer or the Raman spectrophotometer,
• wherein the integrated degree-of-matching calculator calculates the integrated degree of matching after applying the coefficient to the degrees of matching related to the fluorescent X-ray analyzer and the infrared spectrophotometer or the Raman spectrophotometer.