X-ray diffractometer

An X-ray diffractometer comprising:

• a first arm and a second arm, the first arm being rotatably connected to the second arm at a first rotation point;
• a sample holder for holding a sample under investigation, the sample holder being mounted onto the first arm at an outer end of the first arm away from the first rotation point;
• an X-ray source configured to emit a divergent X-ray beam so as to irradiate a surface of the sample, wherein the second arm is rotatably connected to the X-ray source at a second rotation point;
• a detector configured to detect scattered beams coming from the sample, the detector being rotatably arranged around the first rotation point;
• a guiding device configured to guide the sample along a main axis of the X-ray beam thereby varying an angle between the first and second arm, the connection between the first and second arm forces the sample holder to rotate relative to the main axis of the X-ray beam so that an angle between the main axis of the X-ray beam and the surface of the sample is varied;
• and
• a shield rotatably arranged around a third rotation point which rotation point is fixed relative to the detector, the shield is being configured and arranged to shield the detector from the divergent X-ray beam coming from the X-ray source but not obstructing the scattered beams coming from the sample so as to allow the scattered beams to reach the detector.