Polishing method and polishing apparatus
AssigneeShin-Etsu Handotai Co., Ltd.
InventorsJunichi Ueno, Michito Sato, Kaoru Ishii
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AssigneeShin-Etsu Handotai Co., Ltd.
InventorsJunichi Ueno, Michito Sato, Kaoru Ishii
Estimating the term…
A polishing method including rubbing a wafer held by holding means against a polishing pad attached to a turntable while cooling the turntable by supplying a refrigerant to a refrigerant flow path provided in the turntable which is driven to rotate by a motor, thereby performing polishing, the polishing method being characterized in that, during standby after end of the polishing of the wafer and before performing the polishing of a next wafer, a flow volume of the refrigerant is controlled to be less than a flow volume of the refrigerant during the polishing where the wafer is polished, the turntable is rotated by the motor, and a water retaining liquid having a temperature adjusted to a room temperature or more is supplied to the polishing pad.
A method for polishing comprising rubbing a wafer held by holding means against a polishing pad attached to a turntable while cooling the turntable by supplying a refrigerant to a refrigerant flow path provided in the turntable which is driven to rotate by a motor, thereby performing polishing of the wafer,
A polishing apparatus comprising:
Dependencies are inferred from the claim text.