Infrared imaging device, fixed pattern noise calculation method, and fixed pattern noise calculation program
AssigneeFUJIFILM Corporation
InventorMakoto Kobayashi
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AssigneeFUJIFILM Corporation
InventorMakoto Kobayashi
Estimating the term…
An infrared imaging device includes an imaging element including a plurality of infrared detection pixels which are two-dimensionally arranged, a diaphragm, and a FPN calculation unit which acquires a first captured image data obtained by capturing an image using the imaging element in a state in which an F-number of the diaphragm is set to a first value and a second captured image data obtained by capturing an image using the imaging element in a state in which the F-number is set to a second value while a motion picture is being captured, and calculates fixed pattern noise included in captured image data obtained by capturing an image using the imaging element based on the acquired first captured image data, the acquired second captured image data, the first value, and the second value.
An infrared imaging device comprising:
A fixed pattern noise calculation method that is performed by an infrared imaging device including an imaging element including a plurality of infrared detection pixels which are two-dimensionally arranged and a diaphragm that is provided closer to an object than the imaging element, the method comprising:
A non-transitory computer readable medium storing a fixed pattern noise calculation program that causes an infrared imaging device including an imaging element including a plurality of infrared detection pixels which are two-dimensionally arranged and a diaphragm that is provided closer to an object than the imaging element to perform:
Dependencies are inferred from the claim text.