Pattern-forming method
AssigneeJsr Corporation
InventorsTakehiko Naruoka, Tomohisa Fujisawa, Motohiro Shiratani, Hisashi Nakagawa
Life of this patent
Estimating the term…
Abstract
A pattern-forming method includes applying a radiation-sensitive composition on a substrate to provide a film on the substrate. The film is exposed. The film exposed is developed. The radiation-sensitive composition includes a metal-containing component that is a metal compound having a hydrolyzable group, a hydrolysis product of the metal compound having a hydrolyzable group, a hydrolytic condensation product of the metal compound having a hydrolyzable group, or a combination thereof. A content of a transition metal atom in the metal-containing component with respect to total metal atoms in the metal-containing component is no less than 50 atomic %.
Claims22
A pattern-forming method comprising:
- applying a radiation-sensitive composition on a substrate to provide a film on the substrate;
- exposing the film via a mask which has a predetermined pattern;
- and
- developing the film exposed to form a pattern in the film,
- wherein:
- the radiation-sensitive composition comprises a metal-containing component that is a metal compound having a hydrolyzable group, a hydrolysis product of the metal compound having a hydrolyzable group, a hydrolytic condensation product of the metal compound having a hydrolyzable group, or a combination thereof;
- a content of a transition metal atom in the metal-containing component with respect to total metal atoms in the metal-containing component is no less than 50 atomic %;
- and
- the metal compound having a hydrolyzable group comprises a compound represented by formula (1):
- LaMXb (1)
- wherein in the formula (1),
- M represents a transition metal atom,
- L represents a ligand, and a is 1 or 2, wherein in a case where a is 2, a plurality of Ls are identical or different, and
- X represents a hydrolyzable group selected from a halogen atom, an alkoxy group and a carboxylate group, and b is an integer of 2 to 6, wherein in a case where b is no less than 2, a plurality of Xs are identical or different, wherein the ligand represented by L does not fall under the definition of X.
A pattern-forming method comprising:
- applying a radiation-sensitive composition on a substrate to provide a film on the substrate;
- exposing the film via a mask which has a predetermined pattern;
- and
- developing the film exposed to form a pattern in the film,
- wherein:
- the radiation-sensitive composition comprises a metal-containing component that is a metal compound having a hydrolyzable group, a hydrolysis product of the metal compound having a hydrolyzable group, a hydrolytic condensation product of the metal compound having a hydrolyzable group, or a combination thereof;
- a content of a transition metal atom in the metal-containing component with respect to total metal atoms in the metal-containing component is no less than 50 atomic %;
- and
- the exposing is carried out by irradiation with an extreme ultraviolet ray.
Dependencies are inferred from the claim text.