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US 10,520,714 B2Granted
Systems and methods for instant total internal reflection fluorescence/ structured illumination microscopy
AssigneeThe United States of America, as represented by the Secretary, Department of Health and Human Services
InventorsHari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
Life of this patent
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Abstract
Embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are disclosed.
Claims20
A system for structured illumination microscopy comprising:
- a light source for generating an excitation light beam;
- a first micro lens array for splitting the excitation beam into an array of excitation foci;
- a first lens aligned along the first axis and positioned one focal length away from a focal point of the first micro lens array, the first lens focusing the array of excitation foci;
- a radial aperture block aligned along the first axis positioned at a front focal plane of the first lens, the radial aperture block being configured to block a plurality of low-angle central rays of the array of excitation foci, while allowing a plurality of high-angle, marginal rays of the array of excitation foci to pass through the radial aperture block, wherein the high-angle marginal rays are focused by the first lens along a high-angle and low-angle central rays are focused by the first lens along a low-angle;
- a galvanometric mirror aligned and positioned for redirecting and scanning the high-angle, marginal rays through an objective lens for focusing the redirected high-angle, marginal rays along a sample that generates an excitation by the sample and then the excitation from the sample is rescanned to generate a patterned fluorescence emissions onto a second microlens array for locally contracting the patterned fluorescence emissions into a contracted pattern of fluorescence emissions;
- and
- a mirror arrangement for redirecting the contacted patterned fluorescence emissions onto a detector for detecting the patterned fluorescence emissions emitted by the sample.
4 more elements
A system for structure illumination microscopy comprising:
- a light source for generating an excitation light beam;
- a first micro-lens array for splitting the excitation beam into an array of excitation foci;
- a first lens aligned along the first axis and positioned one focal length away from a focal point of the first micro-lens array, the first lens focusing the array of excitation foci;
- a digital micro-mirror device positioned at a front focal plane of the first lens, the digital micro-mirror device being operable to reflect a plurality of low-angle central rays of the array of excitation foci off axis relative to an axis defined by the digital micro-mirror device such that only high-angle marginal rays that are focused by the first lens along a high-angle are not reflected by the digital micro-mirror device;
- a galvanometric mirror positioned for redirecting and scanning the high-angle, marginal rays through an objective lens for focusing the redirected high-angle, marginal rays along a sample that generates an excitation by the sample and then the excitation from the sample is rescanned by the galvanometric mirror to generate a patterned fluorescence emissions onto a second microlens array for locally contracting the patterned fluorescence emissions into a contracted patterned fluorescence emissions;
- and
- a mirror arrangement for redirecting the contacted patterned fluorescence emissions onto a detector for detecting the patterned fluorescence emissions emitted by the sample.
4 more elements
A system for structured illumination microscopy comprising:
- a light source for generating an excitation light beam;
- a spatial light modulator for controlling the phase of the excitation beam for generating an array of excitation foci with minimal interference between each excitation foci;
- a first lens positioned one focal length away from a focal point of the spatial light modulator, the first lens focusing the array of excitation foci;
- a radial aperture block aligned along the first axis positioned at a front focal plane of the first lens, the radial aperture block being configured to block a plurality of low-angle central rays of the array of excitation foci, while allowing a plurality of high-angle, marginal rays of the array of excitation foci to pass through the radial aperture block, wherein the high-angle marginal rays are focused by the first lens along a high-angle and low-angle central rays are focused by the first lens along a low-angle;
- a galvanometric mirror aligned and positioned for redirecting and scanning the high-angle, marginal rays through an objective lens for focusing the redirected high-angle, marginal rays along a sample that generates an excitation by the sample and then the excitation from the sample is rescanned to generate a patterned fluorescence emissions onto a microlens array for locally contracting the patterned fluorescence emissions into a contracted patterned fluorescence emissions;
- and
- a mirror arrangement for redirecting the contracted patterned fluorescence emissions onto a detector for detecting the patterned fluorescence emissions emitted by the sample.
4 more elements
Dependencies are inferred from the claim text.