Analysis method and analysis device
AssigneeJVC KENWOOD Corporation
InventorsMasayuki Ono, Makoto Itonaga, Yuichi Hasegawa, Koji Tsujita, Shigehiko Iwama
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AssigneeJVC KENWOOD Corporation
InventorsMasayuki Ono, Makoto Itonaga, Yuichi Hasegawa, Koji Tsujita, Shigehiko Iwama
Estimating the term…
An analysis method irradiates, with laser light, an analysis substrate made of a resin material and having a reaction region on which detection target substances and nanoparticles of a metal compound for labeling the detection target substances are captured. The analysis method extracts, as a substrate signal level, a signal level generated when receiving reflected light from the analysis substrate. The analysis method receives reflected light from the reaction region to generate a light reception level signal. The analysis method extracts a nanoparticle detection signal from the light reception level signal of the reflected light from the reaction region, the nanoparticle detection signal having a higher level than the signal level of the reflected light from the analysis substrate. The analysis method detects the nanoparticles in accordance with the extracted nanoparticle detection signal.
An analysis method comprising:
An analysis device comprising:
Dependencies are inferred from the claim text.