Particle characterisation
AssigneeMalvern Panalytical Limited
InventorsJason Corbett, Alex Malm
Life of this patent
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Abstract
Disclosed herein is a method of characterizing particles in a sample. The method comprises illuminating the sample in a sample cell with a light beam, so as to produce scattered light by the interaction of the light beam with the sample; obtaining a time series of measurements of the scattered light from a single detector; determining, from the time series of measurements from the single detector, which measurements were taken at times when a large particle was contributing to the scattered light; determining a particle size distribution, including correcting for light scattered by the large particle.
Claims20
A method of characterising particles in a sample, comprising:
- illuminating the sample in a sample cell with a light beam, so as to produce scattered light by the interaction of the light beam with the sample;
- obtaining a time series of measurements of the scattered light from a detector;
- determining, from the time series of measurements from the detector, which measurements were taken at times when a large particle was contributing to the scattered light;
- determining a particle characteristic from the time series of measurements, including correcting for light scattered by the large particle;
- wherein correcting for light scattered by the large particle comprises determining a model of the background due to the large particle, and removing the model from the measurements.
An apparatus for characterising particles comprising:
- a light source, a sample cell, a detector and a processor;
- wherein
- the light source is operable to illuminate a sample within the sample cell with a light beam so as to produce scattered light by interactions of the light beam with the sample;
- the detector is configured to detect the scattered light and produce a time series of measurements;
- the processor is configured to:
- receive the time series of measurements, and
- determine, from the time series of measurements, which measurements were taken at times when a large particle was contributing to the scattered light;
- determine a particle characteristic from the time series of measurements, including correcting for light scattered by the large particle;
- wherein correcting for light scattered by the large particle comprises determining a model of the light scattered by the large particle, and removing the model from the measurements.
Dependencies are inferred from the claim text.