Optical measurement apparatus
AssigneeIndustrial Technology Research Institute
InventorShang-Chun Chen
Life of this patent
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AssigneeIndustrial Technology Research Institute
InventorShang-Chun Chen
Estimating the term…
An optical measurement apparatus configured to measure a photonic integrated circuit (photonic IC) is provided. The optical measurement apparatus includes a substrate, at least one optical waveguide device, a first connector, and a second connector. The at least one optical waveguide device is disposed on the substrate. The first connector and the second connector are connected with the at least one optical waveguide device. An optical signal from a first optical fiber is transmitted to the at least one optical waveguide device through the first connector, transmitted to the inside of the photonic IC though at least one first evanescent coupler of the photonic IC, transmitted to the at least one optical waveguide device through at least one second evanescent coupler of the photonic IC, and transmitted to a second optical fiber through the second connector in sequence.
An optical measurement apparatus configured to measure a photonic integrated circuit (photonic IC), the optical measurement apparatus comprising:
Dependencies are inferred from the claim text.