# US 10,502,776 B2 · Circuit board testing system > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,502,776 B2 - Document ID: US10502776B2 - Status: Granted - Kind: B2 - Application number: 15/951,742 - Filed: 2018-04-12 - Published: 2019-06-20 - Granted: 2019-12-10 - Earliest claimed: 2017-12-15 - Assignees: Primax Electronics Ltd. - Applicants: Primax Electronics Ltd. - Inventors: Pei-Ming Chang; Yang-Te Chung - Web page: https://patentgrep.com/patent/US10502776B2 ## CPC - G01R 31/2801: {Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] (G01R31/318508 takes precedence; contactless testing G01R31/302; testing contacts or connections G01R31/66)} - G01R 31/2806: {Apparatus therefor, e.g. test stations, drivers, analysers, conveyors (G01R31/2805, G01R31/281, G01R31/2818 take precedence)} - G01R 31/3004: {Current or voltage test} - G01R 31/70: Testing of connections between components and printed circuit boards (G01R31/68 takes precedence) - G01R 31/2635: {Testing light-emitting diodes, laser diodes or photodiodes} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A circuit board testing system includes a testing fixture. The testing fixture is used for testing plural wires of a cable of a circuit board. The testing fixture includes a first contact element, a switch circuit, a second contact element, a voltage acquisition element and a control unit. The first contact element is connected with input terminals of the plural wires. The second contact element is connected with output terminals of the plural wires. When the control unit drives a switching action of the switch circuit, a testing voltage is provided to the odd-numbered wires or the even-numbered wires. The control unit reads the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires from the voltage acquisition element so as to judge whether the plural wires of the cable are normal. ## Claims ### Claim 1 A circuit board testing system comprising a testing fixture, the testing fixture being connected with a circuit board for testing plural wires of a cable of the circuit board, the testing fixture comprising: a first contact element connected with input terminals of odd-numbered wires of the plural wires and input terminals of even-numbered wires of the plural wires; a switch circuit connected with the first contact element, and providing a testing voltage to the first contact element; a second contact element connected with output terminals of the odd-numbered wires and output terminals of the even-numbered wires; a voltage acquisition element connected with the second contact element, and acquiring voltage values of the plural wires; and a control unit connected with the voltage acquisition element and the switch circuit, and reading the voltage values of the plural wires from the voltage acquisition element, wherein when the control unit drives a switching action of the switch circuit, the testing voltage is provided to the odd-numbered wires or the even-numbered wires, and the control unit reads the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires from the voltage acquisition element, wherein the control unit judges whether functions of the plural wires of the cable are normal according to the voltage values of the odd-numbered wires and the voltage values of the even-numbered wires. ### Claim 2 (depends on 1) The circuit board testing system according to claim 1, wherein the first contact element comprises a first testing circuit and a second testing circuit, and the second contact element comprises a third testing circuit and a fourth testing circuit. ### Claim 3 (depends on 2) The circuit board testing system according to claim 2, wherein the first testing circuit is connected with the input terminals of the odd-numbered wires through plural first fixed resistors. ### Claim 4 (depends on 2) The circuit board testing system according to claim 2, wherein the second testing circuit is connected with the input terminals of the even-numbered wires through plural third fixed resistors. ### Claim 5 (depends on 2) The circuit board testing system according to claim 2, wherein the third testing circuit is connected with the output terminals of the odd-numbered wires through plural third fixed resistors and connected to a ground terminal through a first ground resistor. ### Claim 6 (depends on 2) The circuit board testing system according to claim 2, wherein the fourth testing circuit is connected with the output terminals of the even-numbered wires through plural fourth fixed resistors and connected to a ground terminal through a second ground resistor. ### Claim 7 (depends on 2) The circuit board testing system according to claim 2, wherein the odd-numbered wires are connected between the first testing circuit and the third first testing circuit in parallel. ### Claim 8 (depends on 7) The circuit board testing system according to claim 7, wherein the voltage acquisition element comprises a first analog input pin, and the first analog input pin is connected with the third testing circuit to acquire the voltage values of the odd-numbered wires. ### Claim 9 (depends on 2) The circuit board testing system according to claim 2, wherein the even-numbered wires are connected between the second testing circuit and the fourth first testing circuit in parallel. ### Claim 10 (depends on 9) The circuit board testing system according to claim 9, wherein the voltage acquisition element comprises a second analog input pin, and the second analog input pin is connected with the fourth testing circuit to acquire the voltage values of the even-numbered wires. ### Claim 11 (depends on 2) The circuit board testing system according to claim 2, wherein the switch circuit comprises an optical relay and a single-pole-single-throw relay, wherein the single-pole-single-throw relay is connected with the optical relay and comprises a common terminal, a first normally closed terminal and a second normally closed terminal, wherein the common terminal is connected with a DC power source, the DC power source provides the testing voltage, the first normally closed terminal is connected with the first testing circuit, and the second normally closed terminal is connected with the second testing circuit. ### Claim 12 (depends on 11) The circuit board testing system according to claim 11, wherein the control unit comprises a digital output pin, and the digital output pin is connected with the optical relay to provide a start voltage to the optical relay, wherein in response to the start voltage, the optical relay is enabled to drive the common terminal of the single-pole-single-throw relay to be connected with the first normally closed terminal or the second normally closed terminal. ### Claim 13 (depends on 1) The circuit board testing system according to claim 1, wherein the testing fixture further comprises a third contact element, and the third contact element is connected with plural LED elements of the circuit board. ### Claim 14 (depends on 13) The circuit board testing system according to claim 13, wherein the third contact element is connected with plural third ground resistors, wherein the plural LED elements are serially connected with the corresponding third ground resistors and connected with a ground terminal. ### Claim 15 (depends on 14) The circuit board testing system according to claim 14, wherein the voltage acquisition element comprises plural third analog input pins, and the plural third analog input pins are connected between the corresponding LED elements and the corresponding third ground resistors so as to acquire voltage values of the LED elements. ### Claim 16 (depends on 15) The circuit board testing system according to claim 15, wherein the control unit reads the voltage values of the corresponding LED elements from the voltage acquisition element.