# US 10,502,766 B2 · Measurement method and apparatus for simultaneous correction of disturbance and offset of sensor > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,502,766 B2 - Document ID: US10502766B2 - Status: Granted - Kind: B2 - Application number: 15/702,539 - Filed: 2017-09-12 - Published: 2018-06-28 - Granted: 2019-12-10 - Earliest claimed: 2016-12-23 - Assignees: Korea Electronics Technology Institute - Applicants: Korea Electronics Technology Institute - Inventors: Won Ki Park; Dae Sung Lee; Dong Sun Kim - Web page: https://patentgrep.com/patent/US10502766B2 ## CPC - G01R 15/205: {using magneto-resistance devices, e.g. field plates} - G01R 15/202: {using Hall-effect devices (Hall elements in arrangements for measuring electrical power G01R21/08)} - G01R 33/0029: {Treating the measured signals, e.g. removing offset or noise} - G01R 33/07: Hall effect devices - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A measurement method and apparatus for correcting a disturbance and an offset of a sensor simultaneously are described. The method includes applying a bias current to first and second sensors of a Wheatstone bridge type connected with each other as a differential structure, and measuring a voltage of the first sensor and a voltage of the second sensor. The method also includes applying a bias current to the first and second sensors in a direction opposite to the direction in the first applying, and measuring a voltage of the first sensor and a voltage of the second sensor. The method further includes calculating a final measurement value based on the measured voltages. Accordingly, the offset and the influence of the disturbance of the sensor can be simultaneously removed through one circuit, such that advantageous effects such as reduced complexity, reduced area/volume, and shortened correction time can be achieved. ## Claims ### Claim 1 A measurement method using a measurement apparatus comprising a first sensor and a second sensor of a Wheatstone bridge type connected with each other as a differential structure, the measurement method comprising: first applying a bias current, in a first direction, to the first sensor and the second sensor; first measuring a voltage of the first sensor and a voltage of the second sensor; second applying a bias current to the first sensor and the second sensor in a second direction opposite to the first direction; second measuring a voltage of the first sensor and a voltage of the second sensor; and calculating a final measurement value based on the voltages measured in the first measuring and the voltages measured in the second measuring, wherein the final measurement value is (V1−V2−V3+V4)/4, where V1 is a voltage of the first sensor measured in the first measuring, V2 is a voltage of the second sensor measured in the first measuring, V3 is a voltage of the first sensor measured in the second measuring, and V4 is a voltage of the second sensor measured in the second measuring. ### Claim 2 (depends on 1) The measurement method of claim 1, wherein the first applying, the first measuring, the second applying, and the second measuring are performed in a state in which a current to be measured through the first sensor and the second sensor flows through a current path. ### Claim 3 (depends on 1) The measurement method of claim 1, wherein the final measurement value is a size of a magnetic field and a size of a current. ### Claim 4 A measurement apparatus comprising: a first sensor of a Wheatstone bridge type; a second sensor of a Wheatstone bridge type connected with the first sensor as a differential structure; a current generator configured to apply a bias current to the first sensor and the second sensor; a first measurement unit configured to measure a voltage of the first sensor; a second measurement unit configured to measure a voltage of the second sensor; and a calculator configured to calculate a final measurement value based on voltages measured by the first measurement unit and the second measurement unit when a bias current is applied, in a first direction, to the first sensor and the second sensor, and voltages measured by the first measurement unit and the second measurement unit when a bias current is applied to the first sensor and the second sensor in a second direction opposite to the first direction, wherein the final measurement value is (V1−V2−V3+V4)/4, where V1 is a voltage of the first sensor which is measured by the first measurement unit when a bias current is applied to the first sensor and the second sensor, V2 is a voltage of the second sensor which is measured by the second measurement unit when a bias current is applied to the first sensor and the second sensor, V3 is a voltage of the first sensor which is measured by the first measurement unit when a bias current of an opposite direction is applied to the first sensor and the second sensor, and V4 is a voltage of the second sensor which is measured by the second measurement unit when a bias current of the opposite direction is applied to the first sensor and the second sensor. ### Claim 5 A measurement method using a measurement apparatus comprising a first sensor and a second sensor of a Wheatstone bridge type connected with each other as a differential structure, the measurement method comprising: first measuring a voltage of the first sensor and a voltage of the second sensor in a state in which a current to be measured through the first sensor and the second sensor flows through a current path in a first direction; second measuring a voltage of the first sensor and a voltage of the second sensor in a state in which a current flows through the current path in a second direction opposite to the first direction; and calculating a final measurement value based on the voltages measured in the first measuring and voltages measured in the second measuring, wherein the final measurement value is (V1−V2−V3+V4)/4, where V1 is a voltage of the first sensor measured in the first measuring, V2 is a voltage of the second sensor measured in the first measuring, V3 is a voltage of the first sensor measured in the second measuring, and V4 is a voltage of the second sensor measured in the second measuring. ### Claim 6 A The measurement apparatus comprising: a first sensor of a Wheatstone bridge type; a second sensor of a Wheatstone bridge type connected with the first sensor as a differential structure; a first measurement unit configured to measure a voltage of the first sensor; a second measurement unit configured to measure a voltage of the second sensor; and a calculator configured to calculate a final measurement value based on voltages measured by the first measurement unit and the second measurement unit in a state in which a current to be measured through the first sensor and the second sensor flows through a current path in a first direction, and voltages measured by the first measurement unit and the second measurement unit in a state in which a current flows through the current path in a second direction opposite to the first direction, wherein the final measurement value is (V1−V2−V3+V4)/4, where V1 is a voltage of the first sensor which is measured by the first measurement unit in a state in which a current to be measured through the first sensor and the second sensor flows in the current path, V2 is a voltage of the second sensor which is measured by the second measurement unit in a state in which a current to be measured through the first sensor and the second sensor flows through the current path, V3 is a voltage of the first sensor which is measured by the first measurement unit in a state in which a current flows through the current path in an opposite direction, and V4 is a voltage of the second sensor which is measured by the second measurement unit in a state in which a current flows through the current path in the opposite direction. ### Claim 7 A non-transitory computer-readable recording medium which has a program stored thereon, for performing a measurement method comprising: first applying a bias current, in a first direction, to a first sensor and a second sensor of a Wheatstone bridge type connected with each other as a differential structure; first measuring a voltage of the first sensor and a voltage of the second sensor; second applying a bias current to the first sensor and the second sensor in a second direction opposite to the first direction; second measuring a voltage of the first sensor and a voltage of the second sensor; and calculating a final measurement value based on the voltages measured in the first measuring and the voltages measured in the second measuring, wherein the final measurement value is (V1−V2−V3+V4)/4, where V1 is a voltage of the first sensor measured in the first measuring, V2 is a voltage of the second sensor measured in the first measuring, V3 is a voltage of the first sensor measured in the second measuring, and V4 is a voltage of the second sensor measured in the second measuring. ### Claim 8 (depends on 1) The measurement method of claim 1, wherein the final measurement value is a measurement value with an influence of a disturbance and an offset on the first sensor and the second sensor being removed. ### Claim 9 (depends on 5) The measurement method of claim 5, wherein the final measurement value is a measurement value with an influence of a disturbance and an offset on the first sensor and the second sensor being removed.