# US 10,485,085 B2 · Extreme ultraviolet light sensor unit and extreme ultraviolet light generation device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,485,085 B2 - Document ID: US10485085B2 - Status: Granted - Kind: B2 - Application number: 16/121,340 - Filed: 2018-09-04 - Published: 2019-01-17 - Granted: 2019-11-19 - Earliest claimed: 2016-04-27 - Assignees: Gigaphoton Inc. - Applicants: Gigaphoton Inc. - Inventors: Hisashi Nara; Hiroshi Someya; Takuya Ishii - Web page: https://patentgrep.com/patent/US10485085B2 ## CPC - H05G 2/009: {Auxiliary arrangements not involved in the plasma generation} - G02B 5/208: {for use with infrared or ultraviolet radiation, e.g. for separating visible light from infrared and/or ultraviolet radiation} - G21K 1/06: using diffraction, refraction or reflection, e.g. monochromators (G21K1/10, G21K7/00 take precedence) - H05G: X-RAY TECHNIQUE (investigating or analysing materials by the use of X-rays G01N23/00; apparatus for X-ray photography G03B42/02; X-ray tubes H01J35/00; TV systems having X-ray input H04N5/321) - G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS - G21K: HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES ## Abstract An extreme ultraviolet light sensor unit according to one aspect of the present disclosure includes a mirror configured to reflect extreme ultraviolet light, a filter configured to transmit the extreme ultraviolet light reflected by the mirror, an optical sensor configured to detect the extreme ultraviolet light having passed through the filter, a purge gas supply unit disposed to supply purge gas to a space between the mirror and the filter, and a pipe part configured to allow plasma light including the extreme ultraviolet light entering from an opening to pass therethrough toward the mirror and allow the purge gas flowing to the space between the mirror and the filter to flow out of the opening. ## Claims ### Claim 1 An extreme ultraviolet light sensor unit comprising: a mirror configured to reflect extreme ultraviolet light; a filter configured to transmit the extreme ultraviolet light reflected by the mirror; an optical sensor configured to detect the extreme ultraviolet light having passed through the filter; a purge gas supply unit disposed to supply purge gas to a space between the mirror and the filter; and a pipe part configured to allow plasma light and the purge gas to pass therethrough, the plasma light including the extreme ultraviolet light to be made incident on the mirror, the purge gas supplied from the purge gas supply unit, the pipe part having an opening serving as a light entry port of the plasma light, the pipe part allowing the plasma light entering from the opening to pass therethrough toward the mirror and allowing the purge gas flowing to the space between the mirror and the filter to flow out of the opening, wherein the gas outflow port of the purge gas supply unit is provided at a position not facing the filter. ### Claim 2 (depends on 1) The extreme ultraviolet light sensor unit according to claim 1, wherein the purge gas supply unit has a gas outflow port from which the purge gas is ejected toward the space between the mirror and the filter. ### Claim 3 (depends on 2) The extreme ultraviolet light sensor unit according to claim 2, wherein the purge gas supply unit ejects hydrogen gas as the purge gas from the gas outflow port during generation of the extreme ultraviolet light. ### Claim 4 (depends on 1) The extreme ultraviolet light sensor unit according to claim 1, wherein the gas outflow port of the purge gas supply unit is open to the mirror. ### Claim 5 (depends on 1) The extreme ultraviolet light sensor unit according to claim 1, wherein the purge gas supply unit is disposed to allow the purge gas to flow to the space between the mirror and the filter, from a second optical path among a first optical path and the second optical path, the first optical path being an optical path for the plasma light to be made incident on the mirror from the opening while passing through the pipe part, and the second optical path being an optical path on which the extreme ultraviolet light reflected by the mirror travels toward the filter. ### Claim 6 (depends on 1) The extreme ultraviolet light sensor unit according to claim 1, further comprising a casing that accommodates the mirror, the filter, and the optical sensor, wherein the casing includes the pipe part and the purge gas supply unit. ### Claim 7 (depends on 6) The extreme ultraviolet light sensor unit according to claim 6, wherein the casing is mounted on a chamber while penetrating a wall of the chamber in which the extreme ultraviolet light is generated, and the opening of the pipe part is positioned inside the chamber. ### Claim 8 (depends on 7) The extreme ultraviolet light sensor unit according to claim 7, wherein the casing includes a flange portion, and the flange portion is positioned outside the chamber, and is fixed to the wall of the chamber via a gasket. ### Claim 9 (depends on 6) The extreme ultraviolet light sensor unit according to claim 6, further comprising a socket fitted to an outside of the casing, wherein: the socket includes: a gas channel forming part that forms a space serving as a gas channel between an outer wall of the casing and an inner wall of the socket; and a pipe connecting section that communicates with the gas channel forming part, and the purge gas is supplied into the casing through the space formed between the outer wall of the casing and the inner wall of the socket. ### Claim 10 (depends on 9) The extreme ultraviolet light sensor unit according to claim 9, wherein the socket is disposed in the chamber in which the extreme ultraviolet light is generated, and the socket is fitted to the casing in the chamber. ### Claim 11 (depends on 9) An extreme ultraviolet light generation device comprising: the extreme ultraviolet light sensor unit according to claim 9; a chamber into which laser light is introduced; and a target feeding unit configured to feed a target into the chamber, the target, fed from the target feeding unit into the chamber, being irradiated with the laser light and being made into plasma to generate extreme ultraviolet light, the socket and a pipe that is connected with the pipe connecting section being disposed inside the chamber, the extreme ultraviolet light generation device further comprising a feedthrough configured to introduce the purge gas from an outside of the chamber to the pipe inside the chamber through a wall of the chamber. ### Claim 12 (depends on 11) The extreme ultraviolet light sensor unit according to claim 11, wherein the pipe is arranged around an inner wall of the chamber. ### Claim 13 (depends on 11) The extreme ultraviolet light sensor unit according to claim 11, wherein the pipe is connected with the gas supply device via a feedthrough. ### Claim 14 (depends on 1) An extreme ultraviolet light generation device comprising: the extreme ultraviolet light sensor unit according to claim 1; a chamber into which laser light is introduced; and a target feeding unit configured to feed a target into the chamber, the target, fed from the target feeding unit into the chamber, being irradiated with the laser light and being made into plasma, to generate the extreme ultraviolet light. ### Claim 15 (depends on 14) The extreme ultraviolet light generation device according to claim 14, wherein in a state where the extreme ultraviolet light sensor unit is mounted on a wall of the chamber, the mirror is disposed below, in a gravity direction, the gas outflow port of the purge gas supply unit. ### Claim 16 (depends on 14) The extreme ultraviolet light generation device according to claim 14, further comprising: a pipe that communicates with the purge gas supply unit; and a gas supply device connected with the pipe and configured to supply the purge gas to the pipe. ### Claim 17 (depends on 14) The extreme ultraviolet light generation device according to claim 14, wherein the target is tin, and the purge gas includes hydrogen. ### Claim 18 (depends on 1) The extreme ultraviolet light sensor unit according to claim 1, wherein the mirror is a mirror including an Mo/Si multilayer film in which molybdenum (Mo) and silicon (Si) are alternately layered. ### Claim 19 (depends on 1) The extreme ultraviolet light sensor unit according to claim 1, wherein the filter is a metallic filter or a metallic filter made of zirconium (Zr) having a film thickness of 300 nm to 600 nm. ### Claim 20 (depends on 1) The extreme ultraviolet light sensor unit according to claim 1, wherein a plurality of optical sensors are disposed, and a position of plasma is calculated from a position and energy detected by each of the optical sensors.