# US 10,484,056 B2 · Analog beam simulation for wired device testing in CP-OFDM systems > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,484,056 B2 - Document ID: US10484056B2 - Status: Granted - Kind: B2 - Application number: 15/666,028 - Filed: 2017-08-01 - Published: 2019-02-07 - Granted: 2019-11-19 - Earliest claimed: 2017-08-01 - Assignees: Keysight Technologies, Inc. - Applicants: Keysight Technologies, Inc. - Inventors: Javier Campos Garcia - Web page: https://patentgrep.com/patent/US10484056B2 ## CPC - H04B 7/0417: Feedback systems - H04B 7/0617: {for beam forming} - H04B 17/294: {with test equipment located at the receiver} - H04B 17/3912: {Simulation models, e.g. distribution of spectral power density or received signal strength indicator [RSSI] for a given geographic region} - H04L 5/0007: {the frequencies being orthogonal, e.g. OFDM(A) or DMT} - H04L 27/2607: {Cyclic extensions} - H04L 27/2636: {with FFT or DFT modulators, e.g. standard single-carrier frequency-division multiple access [SC-FDMA] transmitter or DFT spread orthogonal frequency division multiplexing [DFT-SOFDM]} - H04L 27/26362: {Subcarrier weighting equivalent to time domain filtering, e.g. weighting per subcarrier multiplication (arrangements for removing intersymbol interference at the transmitter end H04L25/03343)} - H04W 72/0446: Resources in time domain, e.g. slots or frames - H01Q 3/26: varying the relative phase or relative amplitude of energisation between two or more active radiating elements; varying the distribution of energy across a radiating aperture ({H01Q3/12,} H01Q3/22, H01Q3/24 take precedence) - H01Q 3/267: {Phased-array testing or checking devices} - H04B 10/0775: {Performance monitoring and measurement of transmission parameters} - H04B: TRANSMISSION - H04L: TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION (arrangements common to telegraphic and telephonic communication H04M) - H04W: WIRELESS COMMUNICATION NETWORKS (broadcast communication H04H; communication systems using wireless links for non-selective communication, e.g. wireless extensions H04M1/72) - H01Q: ANTENNAS, i.e. RADIO AERIALS (radiators or antennas for microwave heating H05B6/72) ## Abstract A test device for simulating analog beams applied to a DUT includes a memory that stores instructions and a processor that executes the instructions. When executed by the processor, the instructions cause the test device to perform a process that includes obtaining, from the memory and based on instructions received for testing the DUT, a predetermined power level for a beam to be simulated for the DUT and a predetermined time delay for the beam to be simulated for the DUT. The process also includes applying the predetermined power level for the beam and the predetermined time delay for the beam to a set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the beam from the perspective of the DUT. The process also includes sending, over a wired connection, the simulated characteristics of the beam from the processor to the DUT. ## Claims ### Claim 1 A test device for simulating analog beams applied to a device under test (DUT), the test device comprising: a memory that stores instructions; and a processor that executes the instructions, wherein, when executed by the processor, the instructions cause the test device to perform a process comprising: obtaining, from the memory and based on received instructions for testing the DUT, a first predetermined power level for a first beam to be simulated for the DUT and a first predetermined time delay for the first beam to be simulated for the DUT; applying the first predetermined power level for the first beam and the first predetermined time delay for the first beam to a first set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the first beam from a perspective of the DUT; and sending, over a wired connection, the simulated characteristics of the first beam from the processor to the DUT for testing the DUT using the simulated characteristics of the first beam to simulate wireless communication without over-the-air (OTA) transmission. ### Claim 2 (depends on 1) The test device of claim 1, wherein the test device comprises a network emulator. ### Claim 3 (depends on 1) The test device of claim 1, wherein the simulated characteristics of the first beam are sent over the wired connection directly to an antenna port of the DUT to test the DUT using the simulated characteristics of the first beam when received by the antenna port connected to the DUT. ### Claim 4 (depends on 1) The test device of claim 1, wherein the instructions for testing the DUT comprise a simulated type of antenna of the DUT. ### Claim 5 (depends on 1) The test device of claim 1, wherein the instructions for testing the DUT comprise a simulated relative orientation of an antenna of the DUT and an antenna of the test device. ### Claim 6 (depends on 1) The test device of claim 1, wherein the instructions for testing the DUT comprise a plurality of beams to be simulated in a configurable pattern for testing the DUT. ### Claim 7 (depends on 6) The test device of claim 6, wherein the memory stores a correspondence between each of the plurality of beams and corresponding predetermined power levels and time delays for each of the plurality of beams. ### Claim 8 (depends on 1) The test device of claim 1, wherein the instructions for testing the DUT specify the first beam, and wherein the memory stores a correspondence between the first beam and the first predetermined power level and the first predetermined time delay for the first beam. ### Claim 9 (depends on 1) The test device of claim 1, wherein, when executed by the processor, the instructions further cause the test device to perform a process comprising: obtaining, from the memory and based on received instructions for testing the DUT, a second predetermined power level for a second beam to be simulated for the DUT and a second predetermined time delay for the second beam to be simulated for the DUT, and applying the second predetermined power level for the second beam and the second predetermined time delay for the second beam to a second set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the second beam from the perspective of the DUT, and sending, over the wired connection, the simulated characteristics of the second beam from the test device to the DUT for further testing the DUT using the simulated characteristics of the second beam to simulate wireless communication without OTA transmission. ### Claim 10 (depends on 9) The test device of claim 9, further comprising: a cyclic prefix orthogonal frequency-division multiplexing transmitter, wherein the first beam and the second beam are simulated to be originated from the cyclic prefix orthogonal frequency-division multiplexing transmitter. ### Claim 11 (depends on 10) The test device of claim 10, wherein each of the first beam and the second beam corresponds to a different cyclic prefix orthogonal frequency-division multiplexing subcarrier. ### Claim 12 (depends on 10) The test device of claim 10, wherein each of the first beam and the second beam corresponds to a different cyclic prefix orthogonal frequency-divisional multiplexing symbol. ### Claim 13 (depends on 1) The test device of claim 1, wherein the DUT comprises a base station that communicates via analog beamforming. ### Claim 14 (depends on 1) The test device of claim 1, wherein, when executed by the processor, the instructions further cause the test device to perform a process comprising: applying the first predetermined time delay as a phase rotation that changes based on subcarrier position in a beam model of the first beam; and performing Inverse Fast Fourier Transform (IFFT) on the beam model to obtain a transformed beam model in which the phase rotation is converted to a cyclic time shift in a time domain. ### Claim 15 A network emulator for simulating analog beams applied to a device under test (DUT), the network emulator comprising: a memory that stores instructions; a processor that executes the instructions; and a transmitter that sends simulated characteristics of a beam to the DUT over a wired connection, wherein, when executed by the processor, the instructions cause the network emulator to perform a process comprising: obtaining, from the memory and based on instructions received for testing the DUT, a predetermined power level for the beam to be simulated for the DUT and a predetermined time delay for the beam to be simulated for the DUT; applying the predetermined power level for the beam and the predetermined time delay for the beam to a set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the beam from a perspective of the DUT, and sending, via the transmitter over the wired connection, the simulated characteristics of the beam from the network emulator to the DUT for testing the DUT using the simulated characteristics of the beam to simulate wireless communication without over-the-air (OTA) transmission. ### Claim 16 A method for simulating analog beams applied to a device under test (DUT), comprising: obtaining, from a memory of a test device and based on instructions received for testing the DUT, a first predetermined power level and a first predetermined time delay for a first beam to be simulated for the DUT; applying the first predetermined power level and the first predetermined time delay for the first beam to a first set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the first beam from a perspective of the DUT; and testing the DUT in response to the simulated characteristics of the first beam by sending, over a wired connection, the simulated characteristics of the first beam from the test device to an antenna port of the DUT, simulating wireless communication without over-the-air (OTA) transmission. ### Claim 17 (depends on 16) The method of claim 16, further comprising: obtaining, from the memory and based on the instructions received for testing the DUT, a second predetermined power level and a second predetermined time delay for a second beam to be simulated for the DUT; applying the second predetermined power level and the second predetermined time delay for the second beam to a second set of subcarriers and cyclic prefix orthogonal frequency-division multiplexing (CP-OFDM) symbol to obtain simulated characteristics of the second beam from the perspective of the DUT; and further testing the DUT in response to the simulated characteristics of the second beam by sending, over the wired connection, the simulated characteristics of the second beam from the test device to the antenna port of the DUT.