# US 10,483,080 B1 · Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,483,080 B1 - Document ID: US10483080B1 - Status: Granted - Kind: B1 - Application number: 16/037,815 - Filed: 2018-07-17 - Granted: 2019-11-19 - Earliest claimed: 2018-07-17 - Assignees: ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH - Applicants: ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH - Inventors: Benjamin John Cook; Dieter Winkler - Web page: https://patentgrep.com/patent/US10483080B1 ## CPC - H01J 37/045: {Beam blanking or chopping, i.e. arrangements for momentarily interrupting exposure to the discharge} - H01J 37/09: Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields - H01J 37/147: Arrangements for directing or deflecting the discharge along a desired path ({H01J37/045 take precedence;} lenses H01J37/10) - H01J 37/244: Detectors; Associated components or circuits therefor - H01J 37/26: Electron or ion microscopes; Electron or ion diffraction tubes - H01J 2237/043: Beam blanking - H01J 2237/0435: Multi-aperture - H01J 2237/0453: multiple apertures - H01J 2237/2448: Secondary particle detectors - H01J 2237/28: Scanning microscopes - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) ## Abstract A charged particle beam dump for a charged particle beam device is described. The beam dump includes an annular shaped body having an inner perimeter wall that defines an open annulus for passing of primary charged particle beamlets, the annular shaped body further having an outer perimeter wall and a bottom wall; and an annular shaped electrode provided partially above the annular shaped body having an inner perimeter side and an outer perimeter side, wherein the inner perimeter side is outside of the radius of the inner perimeter wall of the annular shaped body. ## Claims ### Claim 1 A charged particle beam dump for a charged particle beam device, comprising: an annular shaped body having an inner perimeter wall that defines an opening for passing of primary charged particle beamlets, the annular shaped body further having an outer perimeter wall and a bottom wall; and an annular shaped electrode provided partially above the annular shaped body having an inner perimeter side and an outer perimeter side, wherein the inner perimeter side is outside of the radius of the inner perimeter wall of the annular shaped body. ### Claim 2 (depends on 1) The charged particle beam dump according to claim 1, wherein the bottom wall closes the annular shaped body at a bottom side of the annular shaped body. ### Claim 3 (depends on 1) The charged particle beam dump according to claim 1, wherein the bottom wall has an inclined surface being inclined radially outwardly. ### Claim 4 (depends on 1) The charged particle beam dump according to claim 1, wherein the outer perimeter side of the annular shaped electrode extends up to or beyond the radius of the outer perimeter wall of the annular shaped body. ### Claim 5 (depends on 1) The charged particle beam dump according to claim 1, further comprising: an electrode provided within the annular shaped body and fully or partially below the annular shaped electrode. ### Claim 6 (depends on 5) The charged particle beam dump according to claim 5, wherein the electrode is cylindrical or ring-shaped. ### Claim 7 (depends on 5) The charged particle beam dump according to claim 5, wherein the electrode is connected to a power supply to provide a potential to the electrode. ### Claim 8 (depends on 1) The charged particle beam dump according to claim 1, wherein an inner surface of the annular shaped body is coated with a material reducing generation of backscattered particles or secondary particles. ### Claim 9 (depends on 1) The charged particle beam dump according to claim 1, wherein a wall thickness of the inner perimeter wall is 0.5 mm or below. ### Claim 10 (depends on 1) The charged particle beam dump according to claim 1, wherein the annular shaped body has a shaped selected from the group of: ring shaped, circular shaped, oval shaped, polygon shaped and hexagon shaped. ### Claim 11 (depends on 1) A multi-beam charged particle beam device, comprising: a charged particle beam dump according to claim 1. ### Claim 12 (depends on 11) The multi-beam charged particle beam device according to claim 11, further comprising: a charged particle source configured to emit a primary charged particle beam; an aperture arrangement having openings configured to generate at least a first beamlet and a second beamlet of the primary charged particle beam; and a blanking device, the blanking device comprises; at least a first blanking deflector for the first beamlet and a second blanking deflector for the second beamlet; and a shield assembly having a first shielding element partially or fully surrounding the first blanking deflector. ### Claim 13 (depends on 12) The multi-beam charged particle beam device according to claim 12, wherein the blanking device is upstream of the charged particle beam dump. ### Claim 14 (depends on 13) The multi-beam charged particle beam device according to claim 13, wherein the deflection angle of the blanking device into an annular opening of the charged particle beam dump is 30 mrad or below. ### Claim 15 (depends on 12) The multi-beam charged particle beam device according to claim 12, wherein the at least first blanking deflector includes a multipole device for splitting the first beamlet from the second beamlet. ### Claim 16 (depends on 12) The multi-beam charged particle beam device according to claim 12, further comprising: a multipole arrangement configured to act on the first beamlet and the second beamlet separately. ### Claim 17 (depends on 12) The multi-beam charged particle beam device according to claim 12, further comprising: a detector assembly having a first sensor to detect a first signal beamlet generated by the first beamlet and a second sensor to detect a second signal beamlet generated by the second beamlet. ### Claim 18 A method for operating a charged particle beam device, comprising: generating a primary charged particle beam; generating a first beamlet from the primary charged particle beam and a second beamlet from the primary charged particle beam; scanning the first beamlet and the second beamlet over a specimen; guiding the first beamlet with a first deflection field of a first blanking deflector into an annular shaped body of a charged particle beam dump; and trapping charged particles of the first beamlet or generated by the first beam let by an annular shaped electrode provided partially above the annular shaped body having an inner perimeter side and an outer perimeter side, wherein the inner perimeter side is outside of the radius of an inner perimeter wall of the annular shaped body. ### Claim 19 (depends on 18) The method according to claim 18, further comprising: shielding the first deflection field of the first blanking deflector to reduce crosstalk to the second beamlet. ### Claim 20 (depends on 18) The method according to claim 18, further comprising: attracting charged particles of the first beamlet or generated by the first beamlet towards an electrode provided in the annular shaped body. ### Claim 21 (depends on 18) The method of claim 18, further comprising: trapping the charged particles of the first beamlet or generated by the first beamlet by at least one of: an inclined surface of a bottom wall of the annular shaped body having an inclined surface being inclined radially outwardly; and a coating on an inner surface of the annular shaped body with a material reducing generation of backscattered or secondary particles.