# US 10,482,939 B2 · Magnetic memory device and method of writing magnetic memory device

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- Number: US 10,482,939 B2
- Document ID: US10482939B2
- Status: Granted
- Kind: B2
- Application number: 15/822,877
- Filed: 2017-11-27
- Published: 2018-05-31
- Granted: 2019-11-19
- Earliest claimed: 2016-11-29
- Assignees: Samsung Electronics Co., Ltd.; Korea University Research and Business Foundation
- Applicants: Samsung Electronics Co., Ltd.; KOREA UNIVERSITY Research and Business Foundation
- Inventors: Woo Chang Lim; Kyung-Jin Lee; Gyungchoon Go; Seung-Jae Lee
- Web page: https://patentgrep.com/patent/US10482939B2

## CPC

- G11C 11/16: using elements in which the storage effect is based on magnetic spin effect
- G11C 11/15: using multiple magnetic layers (G11C11/155 takes precedence)
- G11C 11/161: {details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell}
- G11C 11/1675: {Writing or programming circuits or methods}
- G11C 11/1693: {Timing circuits or methods}
- H10B 61/00: Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
- H10N 50/10: Magnetoresistive devices
- H10N 50/80: Constructional details
- G11C: STATIC STORES (semiconductor memory devices H10B)
- H10B: ELECTRONIC MEMORY DEVICES
- H10N: ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR

## Abstract

Embodiments provide a magnetic memory device and a method of writing a magnetic memory device. The magnetic memory device includes a magnetic tunnel junction including a reference layer, a free layer and a tunnel barrier layer between the reference and free layers, and a first conductive line adjacent to the free layer. A first spin-orbit current having a frequency decreasing with time flows through the first conductive line. The writing method includes applying the first spin-orbit current having the frequency decreasing with time to the first conductive line.

## Claims

### Claim 1

A method of writing a magnetic memory device including a magnetic tunnel junction having a free layer, a reference layer, and a tunnel barrier layer between the free layer and the reference layer, and a first conductive line adjacent to the free layer, the method comprising:
applying a first spin-orbit current to the first conductive line, the first spin-orbit current being an alternating current, and
during applying, decreasing a frequency of the first spin-orbit current over time in a fixed manner.

### Claim 2 (depends on 1)

The method as claimed in claim 1, wherein:
the magnetic tunnel junction is on a first surface of the first conductive line, and
the free layer is between the tunnel barrier layer and the first surface of the first conductive line.

### Claim 3 (depends on 1)

The method as claimed in claim 1, wherein applying the first spin-orbit current applies a spin-orbit torque to a magnetic moment of the free layer.

### Claim 4 (depends on 1)

The method as claimed in claim 1, wherein:
the first spin-orbit current has an initial frequency when applying the first spin-orbit current starts,
a magnetic moment of the free layer has an initial natural frequency when applying the first spin-orbit current starts, and
the initial frequency of the first spin-orbit current is equal to or greater than the initial natural frequency of the magnetic moment of the free layer.

### Claim 5 (depends on 1)

The method as claimed in claim 1, wherein applying the first spin-orbit current generates at least two resonances at which a frequency of the first spin-orbit current coincides with a natural frequency of a magnetic moment of the free layer.

### Claim 6 (depends on 5)

The method as claimed in claim 5, wherein the frequency of the first spin-orbit current is greater than the natural frequency of the magnetic moment of the free layer between the at least two resonances.

### Claim 7 (depends on 1)

The method as claimed in claim 1, further comprising:
applying a spin-transfer current passing through the magnetic tunnel junction.

### Claim 8 (depends on 7)

The method as claimed in claim 7, wherein the spin-transfer current is applied after the applying of the first spin-orbit current.

### Claim 9 (depends on 7)

The method as claimed in claim 7, wherein the spin-transfer current and the first spin-orbit current are applied at the same time for at least a certain period of time.

### Claim 10 (depends on 1)

The method as claimed in claim 1, wherein the magnetic memory device further comprises: a second conductive line intersecting the first conductive line, the method further comprising:
applying a second spin-orbit current having a frequency decreasing with time to the second conductive line.

### Claim 11 (depends on 10)

The method as claimed in claim 10, wherein the magnetic tunnel junction is disposed on a crossing point of the first and second conductive lines.

### Claim 12 (depends on 10)

The method as claimed in claim 10, wherein the frequency of the first spin-orbit current is equal to the frequency of the second spin-orbit current.

### Claim 13 (depends on 1)

The method as claimed in claim 1, wherein applying the first spin-orbit current includes
initially applying the first spin-orbit current having an initial frequency at a first time to the first conductive line; and
subsequently applying the first spin-orbit current having a subsequent frequency, less than the initial frequency, at a second time to the first conductive line, the second time after the first time.

### Claim 14 (depends on 13)

The method as claimed in claim 13, wherein:
a magnetic moment of the free layer has an initial natural frequency when applying the first spin-orbit current starts, and
the initial frequency of the first spin-orbit current is equal to or greater than the initial natural frequency of the magnetic moment of the free layer.

### Claim 15 (depends on 13)

The method as claimed in claim 13, further comprising:
applying a spin-transfer current passing through the magnetic tunnel junction.

### Claim 16 (depends on 13)

The method as claimed in claim 13, wherein applying the first spin-orbit current generates at least two resonances at which a frequency of the first spin-orbit current coincides with a natural frequency of a magnetic moment of the free layer.
