# US 10,481,216 B1 · Device for field verification of multi-device power over ethernet > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,481,216 B1 - Document ID: US10481216B1 - Status: Granted - Kind: B1 - Application number: 15/966,565 - Filed: 2018-04-30 - Published: 2019-10-31 - Granted: 2019-11-19 - Earliest claimed: 2018-04-30 - Assignees: Fluke Corporation - Applicants: Fluke Corporation - Inventors: John Paul Hittel - Web page: https://patentgrep.com/patent/US10481216B1 ## CPC - G01R 31/40: Testing power supplies (testing photovoltaic devices H02S50/10) - H04L 12/10: Current supply arrangements - H04L 43/50: Testing arrangements - H04L 43/065: related to network devices - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H04L: TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION (arrangements common to telegraphic and telephonic communication H04M) ## Abstract A power testing device includes a communication port with pins that receive signals from a device under test. First test circuitry is coupled to a first set of pairs of the pins, and second test circuitry is coupled to a second set of pairs of the pins. A switch is coupled to the first test circuitry and/or the second test circuitry. While the switch is in a first state, the first test circuitry and the second test circuitry are electrically isolated from each other. While the switch is in a second state, the first test circuitry and the second test circuitry are not electrically isolated from each other. A processor is coupled to the first test circuitry, the second test circuitry, and the switch. A memory stores instructions that cause the processor to control operation of the first test circuitry, the second test circuitry, and the switch. ## Claims ### Claim 1 A power testing device that tests power providing capabilities of a device under test, the power testing device comprising: a communication port including a plurality of pins, the communication port, in operation, receiving signals from the device under test via a cable that includes a plurality of wires electrically coupled to the pins of the communication port; first test circuitry electrically coupled to a first set of pairs of the pins of the communication port; second test circuitry electrically coupled to a second set of pairs of the pins of the communication port; a switch electrically coupled to at least one of the first test circuitry and the second test circuitry, wherein, while the switch is in a first state, the first test circuitry and the second test circuitry are electrically isolated from each other, and wherein, while the switch is in a second state, the first test circuitry and the second test circuitry are not electrically isolated from each other; a processor coupled to the first test circuitry, the second test circuitry, and the switch; and a memory coupled to the processor, the memory storing processor-readable instructions that, when executed by the processor, cause the processor to: control operation of the first test circuitry; control operation of the second test circuitry; and control the switch to be in one of the first state or the second state. ### Claim 2 (depends on 1) The power testing device of claim 1 wherein the processor-readable instructions, when executed by the processor, cause the processor to independently control the first test circuitry and the second test circuitry. ### Claim 3 (depends on 2) The power testing device of claim 2 wherein the processor-readable instructions, when executed by the processor, further cause the processor to: determine whether probing from the device under test is detected by both the first test circuitry and the second test circuitry while controlling the switch to be in the first state. ### Claim 4 (depends on 3) The power testing device of claim 3, further comprising: a display device, wherein the processor-readable instructions, when executed by the processor, further cause the processor to: in response to determining that probing from the device under test is detected by both the first test circuitry and the second test circuitry: control the first test circuitry to perform testing of the device under test using the first set of pairs of the pins of the communication port; and control the second test circuitry to perform testing of the device under test using the second set of pairs of the pins of the communication port; and after the first test circuitry performs the testing using the first set of pairs of the pins of the communication port and the second test circuitry performs the testing using the second set of pairs of the pins of the communication port: control the display to display a message indicating that the device under test is a dual signature capable device; and control the switch to be in the second state. ### Claim 5 (depends on 4) The power testing device of claim 4 wherein the processor controls the first test circuitry to perform the testing using the first set of pairs of the pins of the communication port and controls the second test circuitry to perform the testing using the second set of pairs of the pins while the processor controls the switch to be in the first state. ### Claim 6 (depends on 4) The power testing device of claim 4 wherein the processor-readable instructions, when executed by the processor, further cause the processor to: in response to determining that probing is detected by the first test circuitry and is not detected by the second test circuitry: control the first test circuitry to perform testing of the device under test using the first set of pairs of the pins of the communication port while controlling the switch to be in the second state; and control the display device to display a message indicating that the device under test is a single signature capable device. ### Claim 7 (depends on 4) The power testing device of claim 4 wherein the processor-readable instructions, when executed by the processor, further cause the processor to: in response to determining that probing is not detected by the first test circuitry and is detected by the second test circuitry: cause control the second test circuitry to perform testing of the device under test using the second set of pairs of the pins of the communication port; and control the display device to display a message indicating that the device under test is a single signature capable device; and in response to determining that probing is not detected by the first test circuitry and the second test circuitry, control the display device to display a message indicating that the device under test is neither a dual nor single signature capable device. ### Claim 8 (depends on 1) The power testing device of claim 1, further comprising: data isolation circuitry electrically coupled to the processor and the second test circuitry, the data isolation circuitry, in operation, providing to the second test circuitry a data signal that is electrically isolated from the first test circuitry; and power isolation circuitry including an input terminal electrically coupled to a terminal which provides a power signal that is not electrically isolated from the first test circuitry, and an output terminal electrically coupled to a power terminal of the second test circuitry, the power isolation circuitry, in operation, providing to the power input terminal of the second test circuitry a power signal that is electrically isolated from the first test circuitry, wherein the switch includes a first terminal electrically coupled to the terminal which provides the power signal that is not electrically isolated from the first test circuitry, and a second terminal electrically coupled to the power input terminal of the second test circuitry, wherein, while the switch is in the first state, the switch does not electrically couple the input terminal of the power isolation circuitry and the output terminal of the power isolation circuitry and does not provide to the power input terminal of the second test circuitry the power signal that is not electrically isolated from the first test circuitry, and wherein, while the switch is in the second state, the switch electrically couples the input terminal of the power isolation circuitry and the output terminal of the power isolation circuitry and provides to the power input terminal of the second test circuitry the power signal that is not electrically isolated from the first test circuitry. ### Claim 9 (depends on 4) The power testing device of claim 4 wherein the processor-readable instructions, when executed by the processor, further cause the processor to: control the display device to display a message indicating a characteristic of power provided by the device under test via the first set of pairs of the pins of the communication port; or control the display device to display a message indicating a characteristic of power provided by the device under test via the second set of pairs of the pins of the communication port; or control the display device to display a message indicating a characteristic of power provided by the device under test via both the first set of pairs of the pins of the communication port and the second set of pairs of the pins of the communication port. ### Claim 10 A method of operating a power testing device that tests power providing capabilities of a device under test, the method comprising: electrically isolating first test circuitry from second test circuitry; determining whether probing by the device under test is detected by both the first test circuitry and the second test circuitry; in response to determining that the probing is detected by both the first test circuitry and the second test circuitry: performing testing of the device under test using a first set of pairs of a plurality of pins of a communication port and the first test circuitry; performing testing of the device under test using a second set of pairs of the pins of the communication port and the second test circuitry; and displaying a message indicating that the device under test is a dual signature capable device; and after performing the testing of the device under test using the first set of pairs of the pins of the communication port and the first test circuitry and performing the testing of the device under test using the second set of pairs of the pins of the communication port and the second test circuitry, de-isolating the first test circuitry from the second test circuitry. ### Claim 11 (depends on 10) The method of claim 10 wherein performing the testing of the device under test using the first set of pairs of the pins of the communication port and the first test circuitry and performing the testing of the device under test using the second set of pairs of the pins of the communication port and the second test circuitry are performed concurrently. ### Claim 12 (depends on 10) The method of claim 10 wherein the performing of the testing using the first set of pairs of the pins of the communication port and the first test circuitry, the performing of the testing using the second set of pairs of the pins of the communication port and the second test circuitry are performed concurrently, and the isolating of the first test circuitry from the second test circuitry are performed concurrently. ### Claim 13 (depends on 10) The method of claim 10 wherein de-isolating the first test circuitry from the second test circuitry is performed after determining that the device under test is the dual signature capable device. ### Claim 14 (depends on 10) The method of claim 10, further comprising: determining that probing is detected by the first test circuitry; determining that probing is not detected by the second test circuitry; in response to determining that probing is detected by the first test circuitry and that probing is not detected by the second test circuitry: performing testing of the device under test using the first set of pairs of the pins of the communication port and the first test circuitry; and displaying a message indicating that the device under test is a single signature capable device. ### Claim 15 (depends on 14) The method of claim 14, further comprising: displaying a message indicating that the device under test provides power by pins 1, 2, 3, and 6 of the communication port. ### Claim 16 (depends on 14) The method of claim 14, further comprising: displaying a message indicating a characteristic of power provided by the device under test via the first set of pairs of the pins of the communication port. ### Claim 17 (depends on 10) The method of claim 10, further comprising: determining that probing is not detected by the first test circuitry; determining that probing is detected by the second test circuitry; in response to determining that probing is not detected by the first test circuitry and that probing is detected by the second test circuitry: performing testing of the device under test using the second set of pairs of the pins of the communication port and the second test circuitry; and displaying a message indicating that the device under test is a single signature capable device. ### Claim 18 (depends on 17) The method of claim 17, further comprising: displaying of a message indicating that the device under test provides power by pins 4, 5, 7, and 8 of the communication port. ### Claim 19 (depends on 17) The method of claim 17, further comprising: displaying of a message indicating a characteristic of power provided by the device under test via the second set of pairs of the pins of the communication port. ### Claim 20 (depends on 10) The method of claim 10, further comprising: determining that probing is not detected by the first test circuitry during the de-isolating of the first test circuitry from the second test circuitry; determining that probing is not detected by the second test circuitry during the de-isolating of the first test circuitry from the second test circuitry; and in response to the determining that probing is not detected by the first test circuitry and that probing is not detected by the second test circuitry, displaying a message indicating that the device under test is neither a dual nor single signature capable device.