# US 10,481,206 B2 · Automatic test equipment (ATE) platform translation > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 10,481,206 B2 - Document ID: US10481206B2 - Status: Granted - Kind: B2 - Application number: 15/259,936 - Filed: 2016-09-08 - Published: 2018-03-08 - Granted: 2019-11-19 - Earliest claimed: 2016-09-08 - Assignees: Texas Instruments Incorporated - Applicants: Texas Instruments Incorporated - Inventors: Ramana Tadepalli; Robert Gabriel Almendarez - Web page: https://patentgrep.com/patent/US10481206B2 ## CPC - G01R 31/31908: {Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns} - G01R 31/3191: {Calibration} - G01R 31/31919: {Storing and outputting test patterns (G01R31/31924 takes precedence; arithmetic and random test patterns generator)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A system that can include a computing device, upon implementing a host test program, can be configured to generate compiled host test instructions based on a non-host test program code that has been prepared in accordance with performance characteristics of a non-host automatic test equipment (ATE) and based on calibration data and/or offset data associated with a host ATE. The system can further include a hardware adapter that can be configured to generate non-host test signals based on host test signals generated by a host ATE and with substantially similar characteristics as test signals generated by the non-host ATE, wherein the host test signals are generated by the host ATE based on the compiled host test instructions. ## Claims ### Claim 1 A system comprising: a computer device, upon implementing a host test program, is configured to generate compiled host test instructions based on a non-host test program code prepared in accordance with performance characteristics of a non-host automatic test equipment (ATE) and based on calibration data and/or offset data associated with a host ATE; and a hardware adapter configured to generate non-host test signals based on host test signals generated by the host ATE and with substantially similar characteristics as test signals generated by the non-host ATE, wherein the host test signals are generated by the host ATE based on the compiled host test instructions. ### Claim 2 (depends on 1) The system of claim 1, further comprising: a device under test (DUT) configured to receive the non-host test signals to verify an operation and/or performance of the DUT. ### Claim 3 (depends on 2) The system of claim 2, wherein the DUT comprises at least one of a memory integrated circuit (IC) chip, a microprocessor, an analog-to-digital (A/D) converter, a digital-to-analog (D/A) converter, an electromagnetic device, an optical device, a micro-electromechanical system, and a radio-frequency (RF) device. ### Claim 4 (depends on 2) The system of claim 2, further comprising: a device interface board (DIB) configured to receive the non-host test signals and stimulate appropriate input pins of the DUT based on the non-host test signals, wherein the hardware adapter is configured to interface with both the host ATE and the DIB. ### Claim 5 (depends on 1) The system of claim 1, further comprising: a calibration and offset data unit configured to calibrate the host ATE to generate the calibration data and/or the offset data, wherein the calibration and offset data unit is further configured to store the calibration data and/or the offset data in memory, wherein the calibration and/or the offset data comprises at least one of a voltage offset value, a current offset value, a positive time delay offset value, a negative time delay offset value, an electrical path length value, an accuracy error value and a path resistance value. ### Claim 6 (depends on 5) The system of claim 5, wherein calibrating the host ATE comprises applying calibration signaling to the host ATE and the hardware adapter to determine a signal propagation delay of the hardware adapter corresponding to the generated offset data. ### Claim 7 (depends on 2) The system of claim 2, wherein the hardware adapter receives from the DUT response signals based on the non-host test signals; and wherein at least one of the host test program and the hardware adapter adjusts timing characteristics of the response signals based on the calibration data and/or the offset data to compensate for a propagation delay of the hardware adapter to generate calibrated response signals. ### Claim 8 A method comprising: receiving, at a hardware adapter, host test signals from a host automatic test equipment (ATE), wherein the host test signals are generated based on machine code compiled from a non-host test program code that has been prepared in accordance with performance characteristics of a non-host ATE and based on calibration data and/or offset data associated with the host ATE; controlling an electrical performance of the hardware adapter based on the host test signals, wherein the hardware adapter is configured to match, within a predetermined tolerance, an electrical performance of the non-host ATE; and generating, at the hardware adapter, non-host test signals based on the electrical performance of the hardware adapter. ### Claim 9 (depends on 8) The method of claim 8, wherein the host test signals control the hardware adapter to generate non-host test signals that match signaling and/or timing characteristics of test signals generated by the non-host ATE. ### Claim 10 (depends on 8) The method of claim 8, further comprising: compiling the non-host test program code based on the calibration data and/or the offset data to generate host test instructions corresponding to the machine code and; and controlling the host ATE to generate the host test signals based on the compiled host test instructions. ### Claim 11 (depends on 10) The method of claim 10, further comprising: inserting One of more hooks corresponding to One of fetch instructions for retrieving One of more calibration and/or offset data values corresponding to the calibration data and/or the offset data stored in memory. ### Claim 12 (depends on 8) The method of claim 8, wherein the non-host test program code comprises One of more tests prepared in accordance with the non-host ATE for testing a device under test (DUT) in a manner that the host ATE does not support; and wherein the electrical performance of the hardware adapter is controlled based on the host test signals to enable the host ATE to support the One of more tests based on the machine code. ### Claim 13 (depends on 8) The method of claim 8, wherein the non-host test program code comprises a test prepared in accordance with the non-host ATE for stimulating a device under test (DUT) corresponding to verifying an operation and/or performance of the DUT; and wherein the test comprises at least one of one of a direct current (DC) parametric test, an alternating current (AC) parametric test, a functional test. ### Claim 14 (depends on 13) The method of claim 13, wherein the DUT comprises at least one of a memory integrated circuit (IC) chip, a microprocessor, an analog-to-digital (A/D) converter, a digital-to-analog (D/A) converter, an electromagnetic device, an optical device, a micro-electromechanical system and a radio-frequency (RF) device. ### Claim 15 (depends on 8) The method of claim 8, wherein controlling an electrical performance of the hardware adapter comprises: adjusting at least one of the characteristics of the host test signals based on the calibration data and/or the offset data, wherein the adjusting is performed at one of at least one of a software level and a hardware level. ### Claim 16 (depends on 8) The method of claim 8, wherein the host ATE and the non-host ATE are configured to have different operational characteristics. ### Claim 17 (depends on 8) The method of claim 8, further comprising: stimulating a device under test (DUT) based on the non-host test signals to cause the DUT to generate test response signals; and adjusting timing characteristics of the test response signals based on the offset data to compensate for a propagation delay of the hardware adapter to generate calibrated test response signals. ### Claim 18 (depends on 17) The method of claim 17, wherein adjusting timing characteristics of the test response signals is performed at least one of at a software level and a hardware level. ### Claim 19 A method comprising: receiving, at a hardware adapter, response signals from a device based on non-host test signals applied to the device, wherein the non-host test signals are generated based on host test signals provided by a host automatic test equipment (ATE) and the host test signals are generated based on machine code compiled from a test program code that has been prepared in accordance with performance characteristics of a non-host ATE; and adjusting timing characteristics of the response signals based on calibration data and/or offset data associated with the host ATE to compensate for a propagation delay of the hardware adapter to generate calibrated response signals. ### Claim 20 (depends on 19) The method of claim 19, wherein the adjusting timing characteristics of the response signals is performed at one of at a software level or a hardware level.