# US 10,481,079 B2 · Path length calibration system and method

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- Number: US 10,481,079 B2
- Document ID: US10481079B2
- Status: Granted
- Kind: B2
- Application number: 15/921,173
- Filed: 2018-03-14
- Published: 2018-07-19
- Granted: 2019-11-19
- Earliest claimed: 2015-09-18
- Assignees: Thermo Electron Scientific Instruments LLC
- Applicants: Thermo Electron Scientific Instruments LLC
- Inventors: Damian W. Ashmead; James V. Howard; Kevin K. Kim; Andrew Martin Braasch
- Web page: https://patentgrep.com/patent/US10481079B2

## CPC

- G01N 21/0303: {Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment (G01N21/031 - G01N21/15 take precedence)}
- G01N 21/27: using photo-electric detection (G01N21/31 takes precedence){; circuits for computing concentration (logarithmic circuits G06G7/24; photometric circuits in general G01J)}
- G01N 21/31: Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {(G01N21/72 takes precedence)}
- G01R 33/07: Hall effect devices
- G01R 33/093: {using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films H01F10/00)}
- G01D 5/145: {influenced by the relative movement between the Hall device and magnetic fields (see G01R33/06)}
- G01N 2021/035: {Supports for sample drops}
- G01N 2021/036: {transformable, modifiable}
- G01N 2201/0668: Multiple paths; optimisable path length
- G01N 2201/08: Optical fibres; light guides
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR

## Abstract

An embodiment of a path length calibration system is described that comprises a swing arm coupled to a first surface; a base coupled to a second surface configured to receive the sample; a position sensor system comprising a first component coupled to the swing arm and a second component coupled to the base, wherein the position sensor system is configured to provide an output voltage when the swing arm is in a down position; and a processor configured to calibrate a zero path length using the output voltage.

## Claims

### Claim 1

A path length calibration system, comprising:
a swing arm coupled to a first surface;
a base coupled to a second surface configured to receive the sample;
a position sensor system comprising a first component coupled to the swing arm and a second component coupled to the base, wherein the position sensor system is configured to provide an output voltage when the swing arm is in a down position; and
a processor configured to calibrate a zero path length using the output voltage.

### Claim 2 (depends on 1)

The system of claim 1, further comprising:
a linear actuator configured to adjust a distance between the first surface and the second surface.

### Claim 3 (depends on 1)

The system of claim 1, wherein:
The first component and the second component are positioned substantially adjacent to one another when the swing arm is in the down position.

### Claim 4 (depends on 3)

The system of claim 3, wherein:
The first component and the second component are aligned on substantially the same axis.

### Claim 5 (depends on 1)

The system of claim 1, wherein:
The first surface is coupled to a first optical conduit and the second surface is coupled to a second optical conduit.

### Claim 6 (depends on 1)

The system of claim 1, wherein:
The first surface is optically coupled to a light source.

### Claim 7 (depends on 1)

The system of claim 1, wherein:
either the first component or the second component emits a field.

### Claim 8 (depends on 7)

The system of claim 7, wherein:
the field comprises a magnet flux field.

### Claim 9 (depends on 8)

The system of claim 8, wherein:
the position sensor system provides a linear range of the output voltage that corresponds to a range of the magnetic flux field.

### Claim 10 (depends on 7)

The system of claim 7, wherein:
wherein either the first component or the second component comprises a sensor configured to detect the field.

### Claim 11 (depends on 1)

The system of claim 1, wherein:
wherein the sensor comprises a linear Hall effect sensor.

### Claim 12 (depends on 1)

The system of claim 1, wherein:
wherein the sensor comprises a giant magnetoresistive (GMR) sensor.

### Claim 13 (depends on 1)

The system of claim 1, wherein:
the base comprises a mechanical stop.