High throughput system for photovoltaic UV degradation testing

A solar cell testing apparatus, comprising:

• a first narrowband light source configured to induce photonic degradation to a solar cell, wherein the inducing includes applying light of a first wavelength to the solar cell;
• a second narrowband light source for applying light of a second wavelength to the solar cell, the second wavelength greater than the first wavelength;
• a detector configured to measure photoluminescence induced from the applied light of the first wavelength;
• a sheet resistance measurement module configured to measure a local resistance of a region of the solar cell;
• and
• an electronic system configured to monitor the photonic degradation of the solar cell from the photoluminescence measurement, and configured to monitor the local resistance of the region of the solar cell.

A method for testing a solar cell, the method comprising:

• applying a first light to a sample region of a solar cell or a partially fabricated solar cell to induce a photonic degradation in the sample region;
• applying a second light to the sample region to induce a local resistance in the sample region;
• monitoring the photonic degradation of the sample region based on a photoluminescence measurement;
• and
• monitoring the local resistance of the sample region based on a sheet resistance measurement.