Storage device and method of manufacturing storage device
AssigneeToshiba Memory Corporation
InventorsYuichi Ito, Kouji Matsuo
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AssigneeToshiba Memory Corporation
InventorsYuichi Ito, Kouji Matsuo
Estimating the term…
According to one embodiment, a method of manufacturing a storage device comprises forming a state change layer on a substrate. The state change layer has first and second resistance states. The state change layer is switchable from one to the other of the first and second resistance states according to a magnitude of a voltage applied thereto. A conductor is formed on an upper surface of the state change layer. The conductor comprises carbon. An upper surface of the conductor is processed to reduce the roughness thereof. A first ferromagnetic material is then formed on the upper surface of the conductor. A nonmagnetic material is formed on an upper surface of the first ferromagnetic material. A second ferromagnetic material is formed on an upper surface of the nonmagnetic material.
A method of manufacturing a storage device, the method comprising:
A method of manufacturing a storage device, the method comprising:
A method of manufacturing a storage device, the method comprising:
Dependencies are inferred from the claim text.