Back to results
US 10,475,710 B1Granted
Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions
AssigneeUchicago Argonne, LLC
InventorsPeijun Guo, Richard D. Schaller
Life of this patent
Estimating the term…
Abstract
A dielectric-coating based technique determines the refractive index of small dimension materials. The technique utilizes a sample of the small dimension material coated with the dielectric and an uncoated sample, where reflectivity is determined for each. The real and imaginary components of the refractive index can be determined for the small-dimension material itself.
Claims19
A method of determining a refractive index of a two-dimensional organic-inorganic hybrid perovskite comprising:
- selecting a dielectric material with a known refractive index;
- depositing a coating of the dielectric material on a first sample of the two-dimensional organic-inorganic hybrid perovskite, forming a coated sample having a thickness;
- engaging the coated sample with a laser of an optical testing device, the laser having a wavelength and a thickness of the coating being no more than ¼ of the wavelength;
- determining a reflectivity of the coated sample;
- determining a reflectivity of an uncoated sample of the two-dimensional organic-inorganic hybrid perovskite;
- determining a change in reflectivity (ΔR) by comparing the reflectivity of the coated sample and the reflectivity of the uncoated sample;
- and
- determining the refractive index of the two-dimensional organic-inorganic hybrid perovskite at the wavelength based upon ΔR and the reflectivity of the uncoated sample.
5 more elements
A method of determining a refractive index of a small dimension material comprising:
- selecting a dielectric material with a known refractive index;
- depositing a coating of the dielectric material on a the small-dimension material so that a portion of the small dimension material is coated with the dielectric material and a second portion of the small dimension material is uncoated by the dielectric material;
- engaging the portion of the small dimension material coated with the dielectric material with a laser of an optical testing device, the laser having a wavelength and a thickness of the coating being no more than ¼ of the wavelength;
- determining a reflectivity of the portion of the small dimension material;
- determining a reflectivity of the second portion of the small dimension material;
- determining a change in reflectivity (ΔR) representing a phase shift exhibited by a comparison of a reflectivity of the portion of the small-dimension material and a reflectivity of the second portion of the small-dimension material;
- and
- determining the refractive index of the second portion of the small-dimension material at the wavelength based upon ΔR and the reflectivity of the second portion of the small-dimension material.
5 more elements
Dependencies are inferred from the claim text.