Magnetic tape having characterized back coating and magnetic layers
AssigneeFUJIFILM Corporation
InventorsTakuto Kurokawa, Norihito Kasada
Life of this patent
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Abstract
A magnetic tape includes a non-magnetic support; a magnetic layer including ferromagnetic powder and a binding agent on one surface side of the non-magnetic support; and a back coating layer including non-magnetic powder and a binding agent on the other surface side of the non-magnetic support. The center line average surface roughness Ra measured regarding a surface of the magnetic layer is less than or equal to 1.8 nm. The contact angle with respect to 1-bromonaphthalene measured regarding the surface of the magnetic layer is 45.0° to 55.0°. Also, the logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding the surface of the back coating layer is less than or equal to 0.060.
Claims7
A magnetic tape comprising:
- a non-magnetic support;
- a magnetic layer including ferromagnetic powder and a binding agent on one surface side of the non-magnetic support;
- and
- a back coating layer including non-magnetic powder and a binding agent on the other surface side of the non-magnetic support,
- wherein the center line average surface roughness Ra measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm,
- the contact angle with respect to 1-bromonaphthalene measured regarding the surface of the magnetic layer is 45.0° to 55.0°,
- the logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding the surface of the back coating layer is 0.010 to 0.060, and
- the logarithmic decrement on the back coating layer side is determined by the following method;
- securing a measurement sample of the magnetic tape with the measurement surface, which is the surface on the back coating layer side, facing upward on a substrate in a pendulum viscoelasticity tester;
- disposing a columnar cylinder edge which is 4 mm in diameter and equipped with a pendulum 13 g in weight on the measurement surface of the measurement sample such that the long axis direction of the columnar cylinder edge runs parallel to the longitudinal direction of the measurement sample;
- raising the surface temperature of the substrate on which the measurement sample has been positioned at a rate of less than or equal to 5° C./min up to 80° C.;
- monitoring the displacement of the pendulum while it is oscillating to obtain a displacement-time curve for a measurement interval of greater than or equal to 10 minutes;
- and
- obtaining the logarithmic decrement Δ from the following equation:
- Δ
- =
- ln
-
- (
- A
- 1
- A
- 2
- )
- +
- ln
-
- (
- A
- 2
- A
- 3
- )
- +
- …
-
-
- ln
-
- (
- A
- n
- A
- n
- +
- 1
- )
- n
- wherein the interval from one minimum displacement to the next minimum displacement is adopted as one wave period;
- the number of waves contained in the displacement-time curve during one measurement interval is denoted by n, the difference between the minimum displacement and the maximum displacement of the nth wave is denoted by An, and the logarithmic decrement is calculated using the difference between the next minimum displacement and maximum displacement of the nth wave (An+1 in the above equation).
Dependencies are inferred from the claim text.