Image analysis device, image analysis method, image analysis system, and recording medium
AssigneeOsaka University
InventorsNaomasa Kawaguchi, Kazuaki Nakane, Akihiro Takiyama
Life of this patent
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AssigneeOsaka University
InventorsNaomasa Kawaguchi, Kazuaki Nakane, Akihiro Takiyama
Estimating the term…
A relationship between constituents of a structure is objectively and appropriately assessed. An image analyzing device includes: a Betti number calculating section (42) configured to calculate the numbers of holes from respective plurality of binarized images, after the plurality of binarized images are generated by binarizing a single captured image, which is obtained by capturing a structure, while making binarization reference values differ from each other; a function specifying section (43) configured to specify a characteristic numerical value that characterizes a correspondence between (i) the respective binarization reference values and (ii) the respective numbers of holes; and an output information generating section (44) configured to generate output information corresponding to the characteristic numerical value.
An image analyzing device comprising:
An image analyzing method for use in an image analyzing device that analyzes a single captured image which is obtained by capturing a structure,
Dependencies are inferred from the claim text.