Segmenting a model within a plasma system
AssigneeLam Research Corporation
InventorsJohn C. Valcore, Jr., Arthur M. Howald
Life of this patent
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AssigneeLam Research Corporation
InventorsJohn C. Valcore, Jr., Arthur M. Howald
Estimating the term…
Systems and methods for segmenting an impedance matching model are described. One of the methods includes receiving the impedance matching model. The impedance matching model represents an impedance matching circuit, which is coupled to an RF generator via an RF cable and to a plasma chamber via an RF transmission line. The method further includes segmenting the impedance matching model into two or more modules of a first set. Each module includes a series circuit and a shunt circuit. The shunt circuit is coupled to the series circuit. The series circuit of the first module is coupled to a cable model and the series circuit of the second module is coupled to an RF transmission model. The series circuit and the shunt circuit of the first module are coupled to the series circuit of the second module. The shunt circuit of the second module is coupled to the RF transmission model.
A system for segmenting an impedance matching model, the method comprising:
A host computer for segmenting an impedance matching model, comprising:
Dependencies are inferred from the claim text.