Methods and systems to detect and correct outliers in a dataset stored in a data-storage device
AssigneeVMware, Inc.
InventorsChandrashekhar Jha, Jobin George, Prateek Sahu, Kumar Gaurav, Jusvinder Singh
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AssigneeVMware, Inc.
InventorsChandrashekhar Jha, Jobin George, Prateek Sahu, Kumar Gaurav, Jusvinder Singh
Estimating the term…
Methods and systems are directed to detection and correction of outliers in a dataset stored in a data-storage device. The dataset comprises parameter data that may be stored and organized in the form of a data table with rows and columns of parameter values. Each column of the parameter data is searched for outlier parameter values based on the parameters values in the same column. The parameter data as a whole may be searched for outlier rows of parameter values based on first and second largest variations in the parameter data. Substitute parameter values are determined for the outlier parameter values based on non-outlier parameter values of the parameter data. The substitute parameter values and corresponding outlier parameter values may be displayed in a database management user interface that enables a user to selectively accept or reject each of the substitute parameter values for the corresponding outlier parameter values.
An automated method stored in one or more data-storage devices and executed using one or more processors to detect and correct outliers in a dataset stored in a data-storage device, the method comprising:
A system to detect and correct outliers in a dataset stored in a data-storage device, the system comprising:
A non-transitory computer-readable medium encoded with machine-readable instructions that implement a method carried out by one or more processors of a computer system to perform the operations of
Dependencies are inferred from the claim text.