Method and device for economizing computing resources to be used during a process of verification of convolutional parameters using test pattern to enhance fault tolerance and fluctuation robustness in extreme situations
AssigneeStradivision, INC.
InventorsKye-Hyeon Kim, Yongjoong Kim, Insu Kim, Hak-Kyoung Kim, Woonhyun Nam, SukHoon Boo, Myungchul Sung, Donghun Yeo, Wooju Ryu, Taewoong Jang, Kyungjoong Jeong, Hongmo Je, Hojin Cho
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