Abnormality analysis system and analysis apparatus
AssigneeJtekt Corporation
InventorsToshiyuki Tsuzuki, Katsushi Kitamura, Koji Kito, Sakon Murayama, Yuki Ishigure
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AssigneeJtekt Corporation
InventorsToshiyuki Tsuzuki, Katsushi Kitamura, Koji Kito, Sakon Murayama, Yuki Ishigure
Estimating the term…
A plurality of production facilities and an analysis apparatus are connected through a fog network. The analysis apparatus performs a data analysis based on detection information of detectors acquired through the fog network and stores determination information relating to an abnormality of each of the plurality of production facilities or an abnormality of a production object as a result of the data analysis. Each of the plurality of production facilities determines an abnormality of the each of the plurality of production facilities or an abnormality of the production object based on the determination information stored in the analysis apparatus.
An abnormality analysis system comprising:
An abnormality analysis system comprising:
Dependencies are inferred from the claim text.