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US 10,473,725 B2Granted
Method and system for calculating low voltage expression level of a secondary battery
AssigneeLG Chem, Ltd.
InventorsSo Hee Kim, Nak Gi Sung, Joon Sung Bae
Life of this patent
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Abstract
A method for calculating a leakage current of a precipitate by using a voltage drop amount result measured in an aging process according to a discharge voltage of a normal cell and a profile according to a discharge voltage of a normal cell and directly presenting a low voltage expression level based thereon.
Claims9
A method for detecting a low voltage defect expression level of a secondary battery by a process of inspection a defect of a battery cell of the secondary battery, the method comprising:
- (a) setting a defect inspection section in an aging process of the battery cell;
- (b) measuring an open circuit voltage (OCV) Vs of the battery cell at a start of the defect inspection section;
- (c) measuring an open circuit voltage (OCV) Ve of the battery cell at an end of the defect inspection section;
- (d) confirming battery cell capacities Cs and Ce at the Vs and Ve by using a discharge voltage profile of a normal cell;
- and
- (e) calculating a leakage current by using time required for the defect inspection section and a capacity change value Cd between Cs and Ce.
3 more elements
A system for detecting a low voltage expression level of a secondary battery, the system comprising:
- a measuring unit, a storage unit, and a calculation unit,
- wherein the measuring unit includes a voltage measuring unit of a battery cell and a consumption time measuring unit of a defect inspection section,
- wherein the storage unit includes a discharge voltage profile storage unit of the normal cell, a defect determination result storage unit, and a leakage current average value storage unit of the normal cell, and
- wherein the calculation unit includes a leakage current calculation unit of the battery cell, and a precipitate leakage current calculation unit.
1 more element
Dependencies are inferred from the claim text.