Back to results
US 10,473,717 B2Granted
Methods and apparatus for test insertion points
AssigneeTexas Instruments Incorporated
InventorWilson Pradeep
Life of this patent
Estimating the term…
Abstract
Described examples include a method of providing K bits of test data to a combinatorial circuit. The method further includes generating N bits of test data using the combinatorial circuit, where N is greater than K. The method further includes providing the N bits of test data to a module under test.
Claims14
A circuit comprising:
- a first storage element storing at least a first bit of K bits, wherein K is an integer greater than 1, wherein the K bits are test data;
- a second storage element storing at least a second bit of K bits;
- a combinatorial network coupled to the first storage element and the second storage element, the combinatorial network configured to provide N output bits on N outputs, wherein each N output bit is provided on a respective output of the N outputs, the N output bits are derived from the K bits, N is an integer greater than K;
- a multiplexor having a first set of inputs that is adapted to be coupled to an output of a first module and a second set of N inputs, wherein each input in the second set of N inputs is coupled to a respective output of the N outputs of the combinatorial network.
1 more element
A method of providing data, comprising:
- providing, by a plurality of storage elements, K bits of test data to a combinatorial network, wherein K is an integer greater than 1;
- generating, by the combinatorial network, N output bits of the data as test data, from the K bits, where N is an integer greater than K;
- transmitting, by the combinatorial network, the N output bits to a multiplexor;
- selectively providing, by the multiplexor, in a test mode, the N output bits as the test data to a circuit;
- and
- wherein the multiplexor is operable, in a non-test mode, for selectively coupling N output bits as normal data as the data from a module to the circuit.
3 more elements
Dependencies are inferred from the claim text.