Leakage current measurement circuit, integrated circuit and system including same

A leakage current measurement circuit comprising:

• a leakage generation circuit configured to generate a leakage current from a start time point and generate a leakage voltage signal having a voltage level that changes from an initial voltage based on the leakage current;
• and
• a detection circuit configured to generate a detection signal having an activation time, the detection signal being generated from the start time point to a detection time point, and the detection time point corresponding to when the voltage level of the leakage voltage signal reaches a target voltage,
• wherein the leakage generation circuit includes:
• an N-type semiconductor component connected between a ground voltage and a tracking node, the N-type semiconductor component being configured to operate based on a selection signal, and the leakage voltage signal being provided at the tracking node;
• an N-type transistor connected in series with the N-type semiconductor component between the ground voltage and the tracking node, the N-type transistor being configured to operate based on an enable signal;
• a P-type semiconductor component connected between a power supply voltage and the tracking node, the P-type semiconductor component being configured to operate based on the selection signal;
• and
• a P-type transistor connected in series with the P-type semiconductor component between the power supply voltage and the tracking node, the P-type transistor being configured to operate based on the enable signal.

An integrated circuit formed in a semiconductor die, the integrated circuit comprising:

• a leakage current measurement circuit configured to measure a leakage current of the semiconductor die;
• and
• a monitoring circuit configured to monitor an operation of the integrated circuit based on an output of the leakage current measurement circuit,
• wherein the leakage current measurement circuit comprises:
• a leakage generation circuit configured to generate, based on an enable signal, the leakage current from a start time point and generate a leakage voltage signal having a voltage level that changes from an initial voltage based on the leakage current;
• and
• a detection circuit configured to generate a detection signal having an activation time, the detection signal being generated from the start time point to a detection time point, and the detection time point corresponding to when the voltage level of the leakage voltage signal reaches a target voltage, and
• wherein the leakage current measurement circuit is configured to:
• operate in a first operation mode for measuring an N-type semiconductor component leakage current based on a selection signal indicating the first operation mode;
• and
• operate in a second operation mode for measuring a P-type semiconductor component leakage current based on the selection signal indicating the second operation mode.