IC handler

An integrated circuit (IC) handler configured to convey a plurality of IC devices to a test head having a plurality of sockets, the IC handler comprising:

• a contact head for holding a plurality of IC devices and pushing the plurality of IC devices against said plurality of sockets, and
• a movable arm making said contact head move,
• wherein said movable arm has a supply port of power, said supply port connected to a supply source of power for enabling operation of said contact head,
• said contact head has a plurality of operating parts operating due to said power and a supporting section supporting said plurality of operating parts and attached detachably to said movable arm, each of said operating parts configured to hold one of the plurality of IC devices and push said one of the plurality of IC devices against one of the plurality of sockets,
• said supporting section has a connection port detachably connected to said supply port and a supply path for supplying said power from said connection port connected to said supply port to said plurality of operating parts,
• said movable arm has a clamp lever able to rotate, a clamp shaft able to move linearly, and a link member converting rotational movement of said clamp lever to linear movement of said clamp shaft,
• said clamp shaft pushes said supporting section to make it separate from said movable arm by said linear motion, and wherein:
• said IC handler has interchangeable first and second contact heads as said contact head, and
• the arrays of said plurality of operating parts at said support parts of said first and second contact heads differ from each other and the array of said connection ports at said supporting sections of said first and second contact heads match with each other.