Mixed mode vector network analyser
AssigneeInspirain Technologies Pte Ltd
InventorsHarshang Nileshkumar Pandya, Arvindbhai Chimanbhai Patel
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Abstract
A mixed mode vector network analyzer (VNA) system to measure S-parameters and DC parameters of a differential device under test (DUT) is provided. The mixed mode VNA system measures mixed mode S-parameter measurements (i.e., AC measurements) using an independent resistive reflectometer bridge connected to each of the two ports of the differential DUT. The mixed mode VNA system further measures DC parameters of the differential DUT without impacting the measurement of S-parameters. In one embodiment, the mixed mode VNA system is used to measure multi-port differential DUT. Coupling capacitors provide low enough impedance to even the smallest RF frequency of AC measurement (i.e., measurement of S-parameters).
Claims20
A mixed mode vector network analyzer (VNA) system to measure S-parameters and DC parameters of a differential device under test (DUT), wherein the mixed mode vector network analyzer system comprises:
- a differential transmitter that is configured to provide differential excitation signals to the differential DUT, wherein the differential transmitter comprises:
- a first transmitter port that is coupled to a first DUT port of the differential DUT through a first reflectometer, wherein the first transmitter port provides in-phase excitation signals to the first DUT port, wherein a ground port of the first reflectometer is connected to a ground point via a first coupling capacitor;
- and
- a second transmitter port that is coupled to a second DUT port of the differential DUT through a second reflectometer, wherein the second transmitter provides 180° out-phase excitation signals to the second DUT port, wherein a ground port of the second reflectometer is connected to a circuit ground point via a second coupling capacitor;
- a first receiver that is coupled to a measurement port of the first reflectometer, wherein the first reflectometer is configured to provide an output signal, on the first receiver, corresponding to a received signal from the first DUT port of the differential DUT;
- a second receiver that is coupled to a measurement port of the second reflectometer, wherein the second reflectometer is configured to provide an output signal, on the second receiver, corresponding to a received signal from the second DUT port of the differential DUT, wherein the first reflectometer and the second reflectometer are a resistive reflectometer, wherein the output signals on the first receiver and the second receiver are measured concurrently and synchronously;
- a first DC measurement circuit connected to the ground port of the first reflectometer;
- and
- a second DC measurement circuit connected to the ground port of the second reflectometer.
A method for measuring S-parameters and DC parameters of a differential device under test (DUT) using a mixed mode vector network analyzer system, wherein the method comprises:
- applying, using a differential transmitter, (i) in-phase excitation signals to a first DUT port of the differential DUT, and (ii) 180° out-phase excitation signals to a second DUT port of the differential DUT;
- measuring, using a first reflectometer and a second reflectometer, received signals from the first DUT port and second DUT port to calculate a first output signal at a first receiver and a second output signal at a second receiver wherein a ground port of the first reflectometer is connected to a circuit ground point via a first coupling capacitor and wherein a ground port of the second reflectometer is connected to a circuit ground point via a second coupling capacitor;
- calculating, using the first receiver and the second receiver, a common mode S-parameter and a differential mode S-parameter of the differential DUT from the first output signal and the second output signal;
- and
- measuring, using a first DC measurement circuit and a second DC measurement circuit, the DC parameters of the differential DUT wherein the first DC measurement circuit is connected to the ground port of the first reflectometer and the second DC measurement circuit is connected to the ground port of the second reflectometer.
A method for measuring DC parameter of each conductor of a differential device under test (DUT) using a mixed mode vector network analyzer, wherein the method comprises:
- connecting a first end of a first conductor of the differential DUT to a first DC voltage source;
- connecting a first end of a second conductor of the differential DUT to a circuit ground point through a second current meter and a second fixed resistor;
- connecting first ends of rest of conductors of the differential DUT to the circuit ground point through a current meter and a fixed resistor;
- connecting (i) a second end of the first conductor to a termination point through a third fixed resistor, (ii) a second end of the second conductor the termination point through a fourth fixed resistor, and (iii) second ends of rest of the conductor to the termination point through a fifth fixed resistor;
- measuring current flow in the second conductor and rest of conductors of the differential DUT using the second current meter and the current meter;
- connecting the first end of the second conductor of the differential DUT to a second DC voltage source;
- connecting the first end of the first conductor of the differential DUT to the circuit ground point through a first current meter and a first fixed resistor;
- connecting the first ends of the rest of conductors of the differential DUT to the circuit ground point through the current meter and the fixed resistor;
- measuring current flow in the first conductor and rest of conductors of the differential DUT using the first current meter and the current meter;
- and
- calculating an individual resistance of the first conductor and the second conductor using a computation unit.
Dependencies are inferred from the claim text.