Multi-port measurement technique
AssigneeAdvantest Corporation
InventorGiovanni Bianchi
Life of this patent
Estimating the term…
Abstract
This invention relates to an apparatus, a method and a computer program for calculating one or more scattering parameters of a linear network, the network including a number of N ports adapted to provide electric connections. The apparatus is configured to calculate, and the method includes calculating, one or more scattering parameters of the linear network, which are related to a reference impedance, on the basis of a measured electrical response at one or more ports of the linear network to an incident wave applied at a port of the linear network, measured under the condition that one or more of other ports of the linear network face a reflection coefficient Γ with an amplitude ρ of 0.5 or larger. The computer program is adapted to perform such a method and runs on a computer.
Claims17
An apparatus comprising:
- a device operable to calculate one or more scattering parameters of a linear network comprising a number N of ports adapted to provide electric connections;
- wherein the device is operable to generate and apply an incident wave at a first port of the linear network;
- wherein the device is operable to measure electrical responses to the incident wave at the first port and/or at a second port of the linear network under a condition that one or more of other ports of the linear network face a reflection coefficient Γ, which is defined as (Z−R0)/(Z+R0), with an amplitude ρ of 0.5 or larger, wherein Z is a port impedance;
- wherein the device is operable to use a result of a measurement of the electrical responses at the first port and at the second port in a calculation to calculate a scattering parameter for a 2-port network formed by the first port and the second port and that are related to a reference impedance R0 of the linear network;
- and
- wherein the device is configured to calculate one or more scattering parameters, which are related to the reference impedance R0 of the linear network, on a basis of the electrical responses, wherein the scatter parameter for the 2 port network is used in order to subsequently calculate the one or more scattering parameters of the linear network on a basis of the electrical responses.
A method for calculating one or more scattering parameters of a linear network comprising a number N of ports adapted to provide electric connections,
- the method comprising:
- applying an incident wave at a port of the linear network;
- measuring an electrical response to the incident wave at one or more ports of the linear network under a condition that one or more of other ports of the linear network face a reflection coefficient □□, which is defined as (Z−R0)/(Z+R0), with an amplitude □ of 0.5 or larger, wherein Z is a port impedance;
- calculating the one or more scattering parameters, which are related to a reference impedance R0 of the linear network, on a basis of the electrical response;
- calculating an admittance matrix of the linear network;
- subtracting admittances of residual impedances;
- calculating an S-matrix of the linear network using the inverse of the admittance matrix of the linear network;
- and
- de-embedding a residual impedance at the ports of the linear network from a S-matrix calculated for the linear network.
A non-transitory digital storage medium having a computer program stored thereon to perform a method for calculating one or more scattering parameters of a linear network comprising a number N of ports adapted to provide electric connections, the method comprising:
- applying an incident wave at a first port of the linear network;
- measuring an electrical responses to the incident wave at the first port and/or at a second port of the linear network under a condition that one or more of other ports of the linear network face a reflection coefficient □, which is defined as (Z−R0)/(Z+R0), with an amplitude □ of 0.5 or larger, wherein Z is a port impedance;
- using a result of a measurement of the electrical responses at the first port and at the second port in a calculation to calculate a scattering parameter for a 2-port network formed by the first port and the second port and that are related to a reference impedance R0 of the linear network;
- and
- calculating the one or more scattering parameters, which are related to a reference impedance R0 of the linear network, on a basis of the electrical response, wherein the scatter parameter for the 2 port network is used to subsequently calculate the one or more scattering parameters of the linear network on a basis of the electrical responses.
Dependencies are inferred from the claim text.