Systems and methods for controlling MOSFETs

A method, comprising:

• measuring a line voltage to produce a line voltage measurement;
• measuring a load voltage to produce a load voltage measurement;
• and
• adjusting a voltage ramp waveform for a transition of a first metal-oxide-semiconductor field-effect transistor (MOSFET) and a second MOSFET based on the line voltage measurement and the load voltage measurement to minimize heat generation and electromagnetic interference creation by the MOSFETs, wherein the first MOSFET and the second MOSFET control a current to a load in an alternating current configuration, wherein the voltage ramp waveform is adjusted lower when the load voltage measurement develops a sharp edge at the beginning of the voltage ramp waveform.

A non-transitory computer-readable medium, the computer-readable medium comprising executable instructions for:

• measuring a line voltage to produce a line voltage measurement;
• measuring a load voltage to produce a load voltage measurement;
• and
• adjusting a voltage ramp waveform for a transition of a first metal-oxide-semiconductor field-effect transistor (MOSFET) and a second MOSFET based on the line voltage measurement and the load voltage measurement to minimize heat generation and electromagnetic interference creation by the MOSFETs, wherein the first MOSFET and the second MOSFET control a current to a load in an alternating current configuration, wherein the voltage ramp waveform is adjusted higher when the load voltage measurement develops a notch at the end of the voltage ramp waveform.