Back to results
US 10,473,585 B2Granted
Method and system for measuring a physical parameter of a particulate material
AssigneeMurphy Brown, LLC
InventorsMax Terry Coffey, Christina Ellen Phillips, Jeffrey Alan Hansen
Life of this patent
Estimating the term…
Abstract
The present invention is drawn to methods and systems for using in-line near infrared spectroscopy to determine the physical parameters of a comminuted product.
Claims18
A method for measuring a physical parameter of a particulate material, the method comprising:
- passing a sample of a particulate material through a detection region,
- wherein the sample comprises a flowing stream of particles;
- illuminating the sample with near infrared light from at least one near infrared light source;
- detecting the near infrared light that is reflected by the sample and transmitted past the sample;
- converting, using at least one processor, the detected near infrared light reflection and transmission spectral information into at least one physical parameter value,
- wherein the at least one physical parameter value comprises at least a particle size;
- and
- providing feedback on the one physical parameter based on an optimization analysis.
5 more elements
A system for measuring physical parameter of a particulate material, the system comprising:
- (a) a first mill;
- (b) a first sensor comprising a detection region, an illumination source, and a detector;
- (c) a mixer;
- (d) a second sensor comprising a detection region, an illumination source, and a detector;
- (e) a second mill;
- and
- (f) a third sensor comprising a detection region, an illumination source, and a detector,
- wherein components (a)-(f) are coupled in line, and
- wherein the detection region of at least one of the first sensor, the second sensor, or the third sensor detects near infrared light that is reflected by and transmitted past a particulate material.
6 more elements
Dependencies are inferred from the claim text.