Apparatus for inspecting material property of plurality of measurement objects

An inspection apparatus, comprising:

• a light source generating a first light;
• a first measurement unit configured to receive the first light from the light source and direct the first light to a first measurement object;
• a second measurement unit configured to receive the first light from the light source and direct the first light to a second measurement object which is different from the first measurement object;
• an inspection unit configured to receive a first optical signal provided from the first measurement unit along a first optical path and inspect the first measurement object using the first optical signal, and to receive a second optical signal provided from the second measurement unit along a second optical path that is different from the first optical path and inspect the second measurement object using the second optical signal;
• and
• a measurement position selection unit configured to alternately enable the first and second optical paths by adjusting an angle of a reflection mirror such that when the measurement position selection unit enables the first optical path, the first light travels through the first measurement object before it is received by the inspection unit and the measurement position selection unit enables the second optical path, the first light travels through the second measurement object before it is received by the inspection unit.