Apparatus for illuminating the surface of a material
AssigneePhoenix Contact GmbH & Co. KG
InventorsFred Grunert, Fredrik Hailer, Thomas Nimz
Life of this patent
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Abstract
An apparatus for illuminating the surface of a material, comprising an illuminating device for illuminating the surface of the material with a calibrating light, a recording device for recording a measuring light, emitted by the surface of the material in response to the calibrating light, and a processor device for recording the spectral characteristic of the measuring light that characterizes a diffuse spectral reflectance of the surface of the material, wherein the illuminating device is configured to generate an illuminating light for illuminating the surface of the material that has a spectral characteristic that corresponds to the spectral characteristic of the measuring light.
Claims14
An apparatus for reducing an influence of interfering light to illuminate a surface of a material with an illuminating light, the apparatus comprising:
- a light source configured to illuminate the surface of the material with a calibrating light, wherein the light source comprises lighting elements and a sensor, the lighting elements provided for emitting the calibrating light and the illuminating light, and the sensor provided for recording the light generated by the lighting elements as actual light;
- a detector configured to record a measuring light emitted by the surface of the material in response to the calibrating light and in the presence of interfering light;
- and
- a processor configured to:
- cause the detector to record a spectral characteristic of the measuring light, which characterizes a spectral remission behavior of the surface of the material;
- cause the light source to generate the illuminating light for illuminating the surface of the material in the presence of the interfering light after recording the spectral characteristic of the measuring light,
- automatically adjust the spectral characteristic of the illuminating light in dependence of the spectral characteristic of the measuring light recorded by the detector;
- wherein the spectral characteristic of the illuminating light corresponds to the spectral characteristic of the measuring light, and the interfering light is ambient light, which originates from outside of the apparatus;
- wherein the processor is configured to obtain a measurement signal from the sensor, the measurement signal including an actual illumination signal, and wherein the processor comprises a controller to adjust the lighting elements in the case of a deviation from a desired illumination signal and the actual illumination signal.
A method for reducing an influence of interfering light to illuminate a surface of a material with an illuminating light, the method comprising:
- illuminating the surface of the material with a calibrating light;
- recording a measuring light emitted by the surface of the material in response to the calibrating light and in the presence of interfering light;
- recording a spectral characteristic of the measuring light, which characterizes a spectral remission behavior of the surface of the material;
- automatically adjusting the spectral characteristic of the illuminating light in dependence of the recorded spectral characteristic of the measuring light;
- illuminating the surface of the material with the illuminating light in the presence of interfering light after recording the spectral characteristic of the measuring light, the illuminating light having a spectral characteristic that corresponds to the spectral characteristic of the measuring light, wherein the interfering light is ambient light, which originates from outside of an apparatus for illuminating the surface of the material in accordance with the method;
- obtaining a measurement signal from a sensor recording the illuminating light, which represents an actual illumination signal;
- and
- adjusting the illuminating light in the case of a deviation from a desired illumination signal and the actual illumination signal.
Dependencies are inferred from the claim text.