Semiconductor structure and method of forming the same
AssigneesUnited Microelectronics Corp., Fujian Jinhua Integrated Circuit Co., Ltd.
InventorsFeng-Yi Chang, Fu-Che Lee, Ming-Feng Kuo
Life of this patent
Estimating the term…
Loading patent…
AssigneesUnited Microelectronics Corp., Fujian Jinhua Integrated Circuit Co., Ltd.
InventorsFeng-Yi Chang, Fu-Che Lee, Ming-Feng Kuo
Estimating the term…
A method of forming a semiconductor structure is disclosed. A substrate is provided with a pad metal and a fuse metal formed thereon. A liner and an etching stop layer are formed at least covering a top surface of the fuse metal. A dielectric layer is formed on the substrate and a passivation layer is formed over the dielectric layer. A pad opening and a fuse opening are defined in the passivation layer. A first etching step is performed to remove the dielectric layer from the pad opening and the fuse opening to expose a top surface of the pad metal from the pad opening and an upper surface of the etching stop layer from the fuse opening respectively. A second etching step is performed to remove the etching stop layer from the fuse opening until an upper surface of the liner is exposed.
A semiconductor structure, comprising:
Dependencies are inferred from the claim text.