Back to results
US 10,460,761 B2Granted
Defect registration method
AssigneesKabushiki Kaisha Toshiba, Toshiba Electronic Devices & Storage Corporation
InventorKazuto Kashiwagi
Life of this patent
Estimating the term…
Abstract
According to one embodiment, a defect registration method includes measuring, performing first extracting, and registering. The measuring is measuring, on a unit-area basis, performance of a storage area of a magnetic disk including a plurality of unit areas. The storage area includes a redundant area of a set capacity. The first extracting includes second extracting one or more unit areas in order of increasing the performance. The registering is registering the extracted unit areas of the set capacity as defect locations.
Claims11
A defect registration method comprising:
- measuring, on a unit-area basis, performance of a storage area of a magnetic disk including a plurality of unit areas, the storage area including a redundant area of a set capacity;
- performing first extracting of unit areas up to the set capacity from the plurality of unit areas;
- and
- registering the extracted unit areas of the set capacity as defect locations, wherein
- the first extracting includes second extracting one or more unit areas in order of increasing the performance.
2 more elements
Dependencies are inferred from the claim text.