Semiconductor devices comprising nickel— and copper—containing interconnects
AssigneeMicron Technology, Inc.
InventorsSalman Akram, James M. Wark, William Mark Hiatt
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AssigneeMicron Technology, Inc.
InventorsSalman Akram, James M. Wark, William Mark Hiatt
Estimating the term…
A method of activating a metal structure on an intermediate semiconductor device structure toward metal plating. The method comprises providing an intermediate semiconductor device structure comprising at least one first metal structure and at least one second metal structure on a semiconductor substrate. The at least one first metal structure comprises at least one aluminum structure, at least one copper structure, or at least one structure comprising a mixture of aluminum and copper and the at least one second metal structure comprises at least one tungsten structure. One of the at least one first metal structure and the at least one second metal structure is activated toward metal plating without activating the other of the at least one first metal structure and the at least one second metal structure. An intermediate semiconductor device structure is also disclosed.
A semiconductor device, comprising:
A semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.