3D test chart, adjusting arrangement, forming method and adjusting method thereof
AssigneeNingbo Sunny Opotech Co., Ltd.
InventorsMingzhu Wang, Baozhong Zhang, Chunmei Liu
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Abstract
A 3D test chart, an adjusting arrangement, a forming method, and an adjusting method thereof are disclosed. The 3D test chart provides a plurality of test patterns arranged at different depths. When testing a photographic arrangement, the photographic arrangement is only required to move for one time or even does not need to be moved, so as to obtain an image containing information of different depths, so that the testing and adjusting process of the photographic arrangement can be easily achieved.
Claims8
A 3D test chart arrangement, comprising:
- a plurality of test chart layers arranged in a direction along a depth thereof, wherein each of said test chart layers is provided with at least one test pattern, wherein in the direction along the depth, each of said test pattern of one of said test chart layers does not overlap with other said test patterns of other said test chart layers, wherein set a as a parameter which represents a precision requirement for fitting a back focus of a photographic arrangement to be tested, set EFL as a parameter which represents a focal length, set h as a parameter which represent a position configuration of said 3D test chart, wherein h.sub.j represents a position of jth layer of said test chart layers, wherein a functional equation regarding a position configuration of said test chart layers is as follows:
- a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h)));
- and
- a plurality of carriers which are overlappedly and spacedly aligned with each other, wherein said plurality of test chart layers are formed on said plurality of carriers respectively, wherein a distance between two of said plurality of carriers determines a distance between two of said plurality of test chart layers on said two of said plurality of carriers.
A method of designing a 3D test chart, comprising the following steps:
- (A) collecting a plurality of parameters of a photographic arrangement to be tested, and determining a position configuration of said 3D test chart;
- and
- (B) based on a precision requirement of said photographic arrangement, determining a quantity of test chart layers, and configuring a layout of test patterns of said test chart layers and determining a size of each of said test patterns;
- wherein the step (A) further comprising the steps of
- setting a as a parameter which represents a precision requirement for fitting a back focus of said photographic arrangement to be tested, setting EFL as a parameter which represents a focal length,
- setting h as a parameter which represent a position configuration of said 3D test chart, wherein h.sub.j represents a position of jth layer of said test chart layers, and
- obtaining a functional equation regarding a position configuration of said test chart layers as follows:
- a=−((EFL*(−hj)/(EFL−hj)−(EFL*(−h)/(EFL−h))).
Dependencies are inferred from the claim text.