Method for detecting surface electric field distribution of nanostructures
AssigneesTsinghua University, Hon Hai Precision Industry Co., Ltd.
InventorsJiang-Tao Wang, Peng Liu, Yang Wei, Kai-Li Jiang, Shou-Shan Fan
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Abstract
The disclosure relates to a method for detecting surface electric field distribution of nanostructures. The method includes the following steps of: providing a sample located on an insulated surface of a substrate; spraying first charged nanoparticles to the insulated surface; and blowing vapor to the insulated surface to observe a distribution of the first charged nanoparticles via an optical microscope.
Claims11
A method for detecting surface electric field distribution of nanostructures, the method comprising the following steps of:
- providing a nanostructure sample located on an insulated surface of a substrate;
- spraying first charged nanoparticles to the insulated surface;
- and
- blowing vapor to the insulated surface to image the first charged nanoparticles via an optical microscope.
A method for detecting surface electric field distribution of nanostructures, the method comprising the following steps of:
- providing a nanostructure sample located on an insulated surface of a substrate, and a vapor-condensation-assisted optical microscope system comprising a vapor-condensation-assisted device and an optical microscope comprising a stage, wherein the vapor-condensation-assisted device configured to provide vapor;
- locating a sample on the stage;
- spraying first charged nanoparticles to the insulated surface;
- and
- blowing vapor to the insulated surface to image the first charged nanoparticles via an optical microscope.
Dependencies are inferred from the claim text.