Analysis method for supporting classification

An analysis method for classification assistance having the following steps:

• focusing an analysis beam from a light source into a test dispersion to be classified;
• sensing the analysis beam extending through the test dispersion for optical features (i) of the test dispersion;
• ascertaining measured values (Pi) for the optical features (i) of the test dispersion to be classified,
• wherein the test dispersion is formed from a dispersion medium comprising a dispersed phase, and the dispersed phase has cells or cell components of organic materials,
• calculating a classification index (Y), defined by
• Y
• =
• ∑
• i
• =
• 1
• n
• ⁢
• ⁢
• l
• i
• *
• (
• P
• i
• -
• E
• i
• )
• ⁢
• /
• ⁢
• σ
• i
• wherein the classification index (Y) is dependent on a number (n) of the optical features (i) of the test dispersion, a significance parameter (li) of the respective optical feature (i), a mean value (Ei) of the respective optical feature (i), and a standard deviation (σi) of the respective optical feature (i);
• wherein the significance parameter (li) of the respective optical feature (i) indicates an extent to which a measured value (Pi) of the respective optical feature (i) has an effect on the classification index (Y);
• wherein at least two optical features (i) are taken into consideration for the calculation of the classification index (Y):
• Y(n=2)=l1*(P1−E1)/σ1+l2*(P2−E2)/σ2,
• wherein n=2 and a first optical feature is a measure of optical scattering in a transverse X direction in relation to the analysis beam, and a second optical feature is a measure of optical scattering in a Y direction, which is perpendicular to the X direction and also perpendicular to the analysis beam, and wherein the analysis beam extends through the test dispersion;
• and
• providing a diagnosis proposal based on the classification index that indicates whether the test dispersion originates from a sick patient, a healthy patient, or cannot be determined via a computer applying reduced computing power in response to usage of the significance parameter (li) of the respective optical feature (i).