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US 10,384,408 B2Granted
Process for making a polymeric film
AssigneeDsm IP Assets B.V.
InventorsReinard Jozef Maria Steeman, Marcel Jongedijk
Life of this patent
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Abstract
The invention relates to a process to make films and tapes from ultrahigh molecular weight polyethylene (UHMWPE) in the solid state. The films and tapes according to the invention have an improved thickness whereby the coefficient of variation of the thickness of the film of at most 6%.
Claims8
A process for the manufacturing of an ultrahigh molecular weight polyethylene (UHMWPE) film, comprising in sequence the steps of:
- (a) providing a bed of UHMWPE powder;
- (b) applying a compression pressure on the bed of UHMWPE powder at a compression temperature below a melting temperature of the UHMWPE powder to obtain a compressed bed;
- (c) forming a film by compacting the compressed bed in a smoothing unit comprising two compacting surfaces providing a non-constant line of pressure and a gap having a gap-thickness dimension and a gap length dimension between the two compacting surfaces, at a compacting temperature below the melting temperature of the UHMWPE powder, the non-constant line of pressure being achieved by establishing a substantially constant gap-thickness dimension which has a variation over time between a minimum gap thickness and a maximum gap-thickness (Δcompaction) of at most 20%, and wherein
- the film formed by step (c) exhibits a reduced variation in thickness along its width and/or length as determined by a plurality of tapes slit from the film each having an average thickness (T) such that a plurality of the tapes has a coefficient of variation in thickness (CVthickness) of less than 2% as determined by the following formula using the average thickness (T) of a number of five representative tape lengths each corresponding to a different randomly chosen tape from the plurality of tapes slit from the film:
- CV
- THICKNESS
- =
- ∑
- i
- =
- 1
- n
-
- (
- x
- i
- -
- x
- _
- )
- 2
- n
- -
- 1
- ×
- 1
- x
- _
- ×
- 100
- ,
- wherein
- xi is the average thickness of any one of the representative tape lengths and x is the averaged value over the n=5 measured average thicknesses, where each measured average thickness is an average of at least 10 thickness measurements carried out at randomly chosen locations of the representative tape lengths.
30 more elements
Dependencies are inferred from the claim text.