Calibration of analog-to-digital converter devices
AssigneeAnalog Devices, Inc.
InventorsPaul R. Fernando, Sudarshan Ananda Natarajan
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Abstract
Disclosed herein are systems for calibrating an analog-to-digital converter (ADC) device, as well as related devices and methods. In some embodiments, a system for calibrating an ADC device may include an ADC device, wherein the ADC device includes an ADC and a dither source, and wherein the ADC device is to apply a set of calibration parameters to generate digital outputs. The system may also include calibration circuitry, coupled to the ADC device, to determine which of multiple sets of values of calibration parameters results in the digital outputs having the lowest amount of noise, and to cause the ADC device to apply the calibration parameters associated with the lowest noise.
Claims20
A system for calibrating an analog-to-digital converter (ADC) device, comprising:
- the ADC device, wherein the ADC device includes an ADC and a dither source, and wherein the ADC device is to apply a set of calibration parameters to generate digital outputs;
- and
- calibration circuitry, coupled to the ADC device, to:
- determine a first amount of noise in a first plurality of digital outputs generated by the ADC device when the ADC device applies first values of the set of calibration parameters;
- determine a second amount of noise in a second plurality of digital outputs generated by the ADC device when the ADC device applies second values of the set of calibration parameters;
- determine that the second amount of noise is greater than the first amount of noise;
- and
- in response to the determination that the second amount of noise is greater than the first amount of noise, cause the ADC device to apply the first values of the set of calibration parameters.
An electronic imaging device, including:
- an image sensor to generate analog image data;
- a dithered analog-to-digital converter (ADC) device, coupled to the image sensor, wherein the dithered ADC device is to apply a set of calibration parameters to generate digital image data in response to the analog image data;
- calibration circuitry, coupled to the dithered ADC device, to:
- determine, for each of a plurality of sets of values of calibration parameters, an associated amount of noise in a plurality of digital outputs generated by the dithered ADC device when the dithered ADC device applies an associated set of values of the calibration parameters;
- determine a minimum of the amounts of noise;
- and
- in response to the determination of the minimum amount of noise, cause the dithered ADC device to apply the set of values of the calibration parameters associated with the minimum amount of noise.
A method of calibrating an analog-to-digital converter (ADC) device, comprising:
- setting first values for a set of calibration parameters for the ADC device, wherein the ADC device includes a dither source and an ADC;
- after setting the first values, causing an input of the ADC device to couple to a reference voltage, and causing the ADC device to generate a first plurality of digital outputs;
- determining a first noise measure of the first plurality of digital outputs;
- setting second values for the set of calibration parameters for the ADC device;
- after setting the second values, causing the input of the ADC device to couple to the reference voltage, and causing the ADC device to generate a second plurality of digital outputs;
- determining a second noise measure of the second plurality of digital outputs;
- determining that the first noise measure is less than the second noise measure;
- and
- in response to the determination, setting values for the set of calibration parameters equal to the first values.
Dependencies are inferred from the claim text.