Three-dimensional memory device with self-aligned drain select level isolation structures and method of making thereof
AssigneeSanDisk Technologies LLC
InventorsShinsuke Yada, Xiaolong Hu, Junichi Ariyoshi
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AssigneeSanDisk Technologies LLC
InventorsShinsuke Yada, Xiaolong Hu, Junichi Ariyoshi
Estimating the term…
A three-dimensional memory device includes an alternating stack of insulating layers and electrically conductive layers located over a substrate. An insulating fill material layer and drain select gate electrodes are located over the alternating stack. A group of memory stack structures extends through the alternating stack, and is arranged as rows of memory stack structures. Each memory stack structure is entirely encircled laterally by a respective one of the drain select gate electrodes. The insulating fill material layer includes a drain select level isolation structure extending between neighboring rows of memory stack structures and including a pair of sidewalls containing a respective laterally alternating sequence of planar vertical sidewall portions and concave vertical sidewall portions, and a drain select level field portion adjoined to the drain select level isolation portion.
A three-dimensional memory device, comprising:
Dependencies are inferred from the claim text.