Semiconductor device and method for manufacturing the same
AssigneeKabushiki Kaisha Toshiba
InventorsShinya Kyogoku, Ryosuke Iljima
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AssigneeKabushiki Kaisha Toshiba
InventorsShinya Kyogoku, Ryosuke Iljima
Estimating the term…
According to one embodiment, a semiconductor device includes first to third electrodes, first to fourth semiconductor regions, and a first insulating film. The first electrode includes a first conductive region. The second electrode includes a second conductive region. The first semiconductor region includes first to fourth partial regions. The second semiconductor region includes a fifth partial region. The third semiconductor region includes a sixth partial region provided between the fourth partial region and the fifth partial region. The fourth semiconductor region includes is electrically connected to the second conductive region, and includes first and second portions. The first insulating film includes first to third insulating regions. The first insulating region is positioned between the first portion and the first conductive region. The second insulating region contacts the fourth and sixth partial regions. The third insulating region is positioned between the second portion and the first conductive region.
A semiconductor device, comprising:
Dependencies are inferred from the claim text.