Substrate treatment method, computer storage medium and substrate treatment system
AssigneeTokyo Electron Limited
InventorShinji Kobayashi
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AssigneeTokyo Electron Limited
InventorShinji Kobayashi
Estimating the term…
A substrate treatment method of performing a plurality of predetermined treatments on a substrate to form a plurality of patterns stacked on the substrate, the substrate treatment method includes: a calculation step of calculating, about patterns in two layers stacked on the substrate, a mutual pattern displacement amount being a displacement amount between the patterns in the two layers, based on an end portion positional displacement of a pattern in an upper layer, an end portion positional displacement of a pattern in a lower layer, and an overlay of the patterns in the two layers; and a correction step of correcting, when the mutual pattern displacement amount exceeds a predetermined threshold, treatment conditions in the predetermined treatments to make the mutual pattern displacement amount fall within the predetermined threshold.
A substrate treatment method of performing a plurality of predetermined treatments on a substrate to form a plurality of patterns stacked on the substrate, the substrate treatment method comprising:
A computer-readable storage medium storing a program running on a computer of a control unit configured to control a substrate treatment system so as to cause the substrate treatment system to execute a substrate treatment method of performing a plurality of predetermined treatments on a substrate to form a plurality of patterns stacked on the substrate,
A substrate treatment system configured to form a plurality of patterns stacked on a substrate, the substrate treatment system comprising:
Dependencies are inferred from the claim text.